Three-Dimensional Reconstruction of Atoms in Surface X-Ray Diffraction
スポンサーリンク
概要
- 論文の詳細を見る
We have developed a method of determining directly the structure of surfaces and interfaces as three-dimensional images using X-ray diffraction. The intensity profile along an integral order rod is interpreted as an interference pattern between scattered waves from a substrate whose structure is already known and from surface layers whose structure is the target of investigation. This mechanism is the same as that of holography and has a potentiality to reconstruct electron density. Atomic images of Ge in a-Si/Ge/Si(001) have been obtained by this method.
- 2003-02-15
著者
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SAKATA Osami
Japan Synchrotron Radiation Research Institute
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Nojima Akinobu
Institute For Solid State Physics University Of Tokyo
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Yoda Yoshitaka
Japan Synchrotron Radiation Institute
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Irisawa Toshifumi
Department Of Applied Physics School Of Engineering The University Of Tokyo
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Sumitani Kazushi
Institute For Solid State Physics The University Of Tokyo
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Koh Shinji
Department Of Applied Physics The University Of Tokyo
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Shiraki Yasuhiro
Department Of Applied Physics And Physico-informatics Keio University
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Nakatani Shinichiro
Institute For Solid State Physics The University Of Tokyo
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Takahashi Toshio
Institute For Solid State Physics The University Of Tokyo
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Nojima Akinobu
Institute for Solid State Physics, University of Tokyo, 5-1-5 Kashiwanoha, Kashiwa, Chiba 277-8581, Japan
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Yoda Yoshitaka
Japan Synchrotron Radiation Research Institute (JASRI), SPring-8, 1-1-1 Kouto, Mikazuki-cho, Sayo-gun, Hyogo 679-5198, Japan
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Sakata Osami
Japan Synchrotron Radiation Research Institute (JASRI), SPring-8, 1-1-1 Kouto, Mikazuki-cho, Sayo-gun, Hyogo 679-5198, Japan
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Sumitani Kazushi
Institute for Solid State Physics, University of Tokyo, 5-1-5 Kashiwanoha, Kashiwa, Chiba 277-8581, Japan
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Nakatani Shinichiro
Institute for Solid State Physics, University of Tokyo, 5-1-5 Kashiwanoha, Kashiwa, Chiba 277-8581, Japan
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