A Phase Retrieval Method for Noncrystalline Layers on Crystal Surfaces
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概要
- 論文の詳細を見る
A phase retrieval method for noncrystalline surface layers that involves intensity modulation of the specular reflection under the excitation of a Bragg reflection was applied to a Si(001) single crystal covered with a native oxide layer of a few nanometers thickness. The phases and moduli of the amplitudes of the scatterings from the native oxide layer were uniquely retrieved at three points on the specular truncation rod. The phases and moduli obtained experimentally were consistently explained by a model of a Si(001) single crystal covered with a uniform oxide layer with a rough surface.
- Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文
- 2003-10-15
著者
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Yoda Yoshitaka
Japan Synchrotron Radiation Institute
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Yashiro Wataru
Nanotechnology Research Institute (nri) National Institute Of Advanced Industrial Science And Techno
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SUMITANI Kazushi
The Institute for Solid State Physics, The University of Tokyo
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Takahashi Toshio
The Institute For Solid State Physics The University Of Tokyo
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Yashiro Wataru
Nanotechnology Research Institute (NRI), National Institute of Advanced Industrial Science and Technology (AIST), AIST Tsukuba Central 4, 1-1-1 Higashi, Tsukuba, Ibaraki 305-8562, Japan
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Sumitani Kazushi
The Institute for Solid State Physics, The University of Tokyo, 5-1-5 Kashiwanoha, Kashiwa, Chiba 277-8581, Japan
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Takahashi Toshio
The Institute for Solid State Physics, The University of Tokyo, 5-1-5 Kashiwanoha, Kashiwa, Chiba 277-8581, Japan
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