Si/1ML-Ge/Si(001) Interface Structure Characterized by Surface X-Ray Diffraction and X-Ray Standing-Wave Method
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1995-05-15
著者
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Ando Masami
National Laboratory for High Energy Accelerator Research Organization
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TAKAHASHI Toshio
Institute for Solid State Physics, University of Tokyo
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NAKATANI Shinichiro
Institute for Solid State Physics, University of Tokyo
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Zhang Xiaowei
National Laboratory For High Energy Physics
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SHIRAKI Yasuhiro
Research Center for Advanced Science and Technology (RCAST), The University of Tokyo
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FUKATSU Susumu
Research Center for Advanced Science and Technology (RCAST), The University of Tokyo
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Takahashi Masamitu
Institute for Solid State Physics, The University of Tokyo
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Takahashi T
Nihon Univ. Kanagawa
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Takahashi Masamitu
Institute For Solid State Physics The University Of Tokyo
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Fukatsu Susumu
Research Center For Advanced Science And Technology (rcast) The University Of Tokyo:(present Address
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Nakatani Shinichiro
Institute For Solid State Physics The University Of Tokyo
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Shiraki Yasuhiro
Research Center For Advanced Science And Technology (rcast) The University Of Tokyo
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Takahashi Toshio
Institute For Solid State Physics The University Of Tokyo
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