High Sensitive Imaging of Atomic Arrangement of Ge Clusters Buried in a Si Crystal by X-ray Fluorescence Holography

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概要

• 論文の詳細を見る
• 2006-06-15

著者

• YODA Yoshitaka

  Japan Synchrotron Radiation Research Institute

• USAMI Noritaka

  Institute for Materials Research, Tokoku University

• TAKAHASHI Toshio

  Institute for Solid State Physics, University of Tokyo

• NAKATANI Shinichiro

  Institute for Solid State Physics, University of Tokyo

• SHIRAKI Yasuhiro

  Department of Applied Physics, The University of Tokyo

• SUMITANI Kazushi

  Institute for Solid State Physics, The University of Tokyo

• Yoda Y

  Crest Japan Science And Technology Agency:japan Synchrotron Radiation Research Institute

• Yoda Yoshitaka

  Japan Synchrotron Radiation Reserch Institute Sayou-gun

• Yoda Yoshitaka

  Department Of Applied Physics Faculty Of Engineering The University Of Tokyo

• Usami Noritaka

  Institute For Material Research Tohoku University

• KUSANO Shuji

  Institute for Solid State Physics, The University of Tokyo

• Sumitani Kazushi

  Institute For Solid State Physics The University Of Tokyo

• Takahashi Tetsuo

  National Institute Of Advanced Industrial Science And Technology Power Electronics Research Center

• Takahashi T

  Nihon Univ. Kanagawa

• Takahashi T

  Japan Advanced Institute Of Science And Technology

• Yoda Y.

  Crest Japan Science And Technology Agency

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