AOYAMA Takayuki | Fujitsu Laboratories Lid.
スポンサーリンク
概要
関連著者
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AOYAMA Takayuki
Fujitsu Laboratories Lid.
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Aoyama T
Hitachi Ltd. Ibaraki Jpn
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AOYAMA Takahiro
Daihen Co.
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SUZUKI Kunihiro
Fujitsu Laboratories Ltd.
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Arimoto Hiroshi
Fujitsu Laboratories Limited
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ARIMOTO Hiroshi
Fujitsu Laboratories Ltd.
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Arimoto H
Semiconductor Leading Edge Technologies Inc.
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Suzuki Kunihiro
Fujitsu Laboratories Limited., 10-1 Morinosato-Wakamiya, Atsugi 243-0197, Japan
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TADA Yoko
Fujitsu Laboratories Ltd.
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HORIUCHI Kei
Fujitsu Laboratories Ltd.
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ARIMOTO Hiroshi
Semiconductor Leading Edge Technologies
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Horiuchi K
Fujitsu Laboratories Ltd.
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Horiuchi Kei
Fujitsu Laboratories
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Suzuki K
School Of Science And Engineering Waseda University:kagami Memorial Laboratory For Materials Science
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Suzuki K
Department Of Information And Communication Technology Tokai University
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KATAOKA Yuji
Fujitsu Laboratories Ltd.
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Suzuki Kenshu
Division Of Public Health Department Of Social Medicine Nihon University School Of Medicine
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Suzuki K
Ntt Transmission Systems Laboratories Lightwave Communications Laboratory
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Suzuki K
Assoc. Super‐advanced Electronics Technol. Kanagawa Jpn
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Tada Y
Fujitsu Laboratories Ltd.
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Suzuki Kenji
Institute For Materials Research Laboratory Tohoku University
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Suzuki K
Central Research Laboratory Alps Electric Co. Ltd.
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TASHIRO Hiroko
Fujitsu Laboratories Ltd.
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Tashiro H
Research And Development Center Ricoh Company Ltd.
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Suzuki K
東京大学大学院農学生命科学研究科獣医病理学研究室
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Tashiro Hideo
Riken
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Kataoka Y
Toshiba Corp. Yokohama Jpn
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FUKUTOME Hidenobu
Fujitsu Laboratories Ltd.
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SUGII Toshihiro
FUJITSU LABORATORIES LTD.
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OHKUBO Satoshi
Fujitsu Laboratories Ltd.
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SATOH Akira
FUJITSU LABORATORIES LTD.
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NAMURA Itaru
Fujitsu Laboratories Ltd.
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INOUE Fumihiko
Fujitsu Laboratories Ltd.
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Ohkubo Shuichi
Ulsi Technology Laboratory Fujitsu Laboratories Ltd.
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Fukutome Hidenobu
Fujitsu Laboratories Ltd. Silicon Technologies Laboratories Advanced Cmos Technology Lab.
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Nara Yasuo
Fujitsu Laboratories Ltd.
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HASEGAWA Sigehiko
The Institute of Scientific and Industrial Research, Osaka University
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NAKAMURA Satoshi
Fujitsu Laboratories Ltd.
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OKUNO Masaki
Fujitsu Laboratories Limited
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USUJIMA Akihiro
FUJITSU LIMITED
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Nakamura Ryou
Fujitsu Limited Advanced Lsi Development Div.
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Saiki Takashi
Fujitsu Limited Advanced Lsi Development Div.
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Hasegawa Sigehiko
The Institute Of Scientific And Industrial Research Osaka University
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Nakamura S
Fujitsu Laboratories Limited
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Hosaka Kimihiko
Fujitsu Laboratories Ltd.
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Nakamura Satoshi
Fujitsu Laboratories Limited
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Sugiyama K
Department Of Ophthalmology Gifu University School Of Medicine
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Matsuda Keiko
Toray Res. Center Inc. Shiga Jpn
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Sugiyama Kazuhisa
Department Of Ophthalmology And Visual Sciences Kanazawa University Graduate School Of Medical Scien
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Sugiyama Kazuhisa
Department Of Ophthalmology Gifu University School Of Medicine
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Sugiyama K
Department Of Electrical And Electronic Engineering Musashi Institute Of Technology
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Hattori Takeo
Department of Electrical and Electronic Engineering, Musashi Institute of Technology
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SUGITA Yoshihiro
Fujitsu Laboratories Ltd.
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ITO Takashi
Fujitsu Laboratories Ltd.
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Hattori Tetsuya
Depaetment Of Electrical And Electronic Engineering Tokyo Institute Of Technology
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NAKASHIMA Hisao
The Institute of Scientific and Industrial Research, Osaka University
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IGARASHI Takayuki
Department of Electrical and Electronic Engineering, Musashi Institute of Technology
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MORIKI Kazunori
Department of Electrical and Electronic Engineering, Musashi Institute of Technology
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NAGASAWA Yoshikatsu
Toray Research Center Inc.
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SUGINO Rinshi
Fujitsu Laboratories Lid.
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NAKAMURA Ryou
FUJITSU Ltd.
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Yamaguchi Akihisa
Fujitsu Laboratories Ltd.
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Miyashita Toshihiko
Fujitsu Laboratories Ltd.
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Sugiyama Kazuhisa
Department Of Electrical And Electronic Engineering Musashi Institute Of Technology
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YAMAMOTO Takashi
Toray Research Center, Inc.
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Satoh Shigeo
Fujitsu Laboratories Ltd.
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Saiki Takashi
New Energy And Industrial Technology Development Organization (endo) Alcohol Production Head Office
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Sugino Rinshi
Fujitsu Laboratories Ltd.
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Hattori Takeo
Department Of Electrical & Electronic Engineering Musashi Institute Of Technology
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Igarashi Takayuki
Department Of Electrical And Electronic Engineering Musashi Institute Of Technology
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Moriki Kazunori
Department Of Electrical And Electronic Engineering Musashi Institute Of Technology
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Aoyama Takayuki
Fujitsu Labs. Ltd.
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Aoyama Takayuki
Fujitsu Laboratories Ltd.
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Sugii Toshihiro
Fujitsu Ltd.
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FUKUTOME Hidenobu
Institute of scientific and industrial research, Osaka University
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TAKANO Keizou
Institute of scientific and industrial research, Osaka University
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HASEGAWA Shigehiko
Institute of scientific and industrial research, Osaka University
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NAKASHIMA Hisao
Institute of scientific and industrial research, Osaka University
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Nakamura Tomoji
Fujitsu Ltd.
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SAIKI Takashi
FUJITSU LIMITED, Advanced LSI development div.
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IRINO Kiyoshi
FUJITSU LIMITED
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Irino Kiyoshi
Fujitsu Ltd.
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Takano Keizou
Institute Of Scientific And Industrial Research Osaka University
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Nakamura Tomoji
Fujitsu Lab. Ltd.
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Tamura Naoyoshi
Fujitsu Lab. Ltd.
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Nakashima Hisao
The Institute Of Scientific And Industrial Research Osaka University
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MORISAKI Yusuke
Fujitsu Ltd.
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Sugiyama Naoyuki
Toray Research Center Inc.
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Sugita Yoshihiro
Fujitsu Ltd.
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Hasegawa Shigehiko
Institute Of Scientific And Industrial Research Osaka University
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Ito T
Department Of Chemical Engineering Graduate School Of Engineering Nagoya University
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HOSAKA Kimihiko
FUJITSU LABORATORIES, LTD.
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Usujima Akihiro
Fujitsu Limited Advanced Lsi Development Div.
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Nakashima Hisao
Institute Of Scientific And Industrial Research Osaka University
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Miyamoto Takashi
Toray Research Center Inc.
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Suzuki Kunihiro
Fujitsu Laboratories Ltd., Atsugi, Kanagawa 243-01, Japan
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Aoyama Takayuki
Fujitsu Laboratories Ltd., Atsugi, Kanagawa 243-01, Japan
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Aoyama Takayuki
FUJITSU LABORATORIES LTD., 50 Fuchigami, Akiruno 197-0833, Japan
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Aoyama Takayuki
FUJITSU LABORATORIES LTD. 50 Fuchigami, Akiruno, Tokyo 197-0833, Japan
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Aoyama Takayuki
Fujitsu Laboratories Ltd., 50 Fuchigami, Akiruno, Tokyo 197-0833, Japan
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Aoyama Takayuki
Fujitsu Laboratories Ltd., 10-1 Morinosato-Wakamiya, Atsugi 243-01, Japan
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Saito Masahiro
Toray Research Center, Inc., 3-2-1 Sonoyama, Otsu 520-8567, Japan
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Sugimoto Tomomi
Toray Research Center, Inc., 3-2-1 Sonoyama, Otsu 520-8567, Japan
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Aoyama Takayuki
Fujitsu Laboratories Ltd., 50 Fuchigami, Akiruno, Tokyo 193-0197, Japan
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Hosaka Kimihiko
Fujitsu Laboratories Ltd., 50 Fuchigami, Akiruno, Tokyo 197-0833, Japan
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Satoh Shigeo
Fujitsu Laboratories Ltd., 50 Fuchigami, Akiruno, Tokyo 193-0197, Japan
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Hatada Akiyoshi
Fujitsu Microelectonics, Ltd., 1500 Mizono, Tado, Kuwana, Mie 511-0192, Japan
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Morisaki Yusuke
Fujitsu Laboratories Ltd., 10-1 Morinosato-Wakamiya, Atsugi, Kanagawa 243-01, Japan
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Owada Tamotsu
Fujitsu Ltd., 50 Fuchigami, Akiruno, Tokyo 193-0197, Japan
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Shimamune Yousuke
Fujitsu Laboratories Ltd., 50 Fuchigami, Akiruno, Tokyo 193-0197, Japan
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Saiki Takashi
Fujitsu Limited, 50 Fuchigami, Akiruno, Tokyo 197-0833, Japan
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Kataoka Yuji
Fujitsu Laboratories Ltd., Atsugi, Kanagawa 243-01, Japan
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Kataoka Yuji
Fujitsu Laboratories Ltd., 10-1 Morinosato-Wakamiya, Atsugi 243-01, Japan
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Sugiyama Naoyuki
Toray Research Center, Inc., 3-2-1 Sonoyama, Otsu 520-8567, Japan
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Nakamura Ryou
Fujitsu Limited, 50 Fuchigami, Akiruno, Tokyo 197-0833, Japan
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Hatada Akiyoshi
Fujitsu Laboratories Ltd., 50 Fuchigami, Akiruno, Tokyo 193-0197, Japan
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Usujima Akihiro
Fujitsu Limited, 50 Fuchigami, Akiruno, Tokyo 197-0833, Japan
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Fukutome Hidenobu
FUJITSU LABORATORIES LTD. 50 Fuchigami, Akiruno, Tokyo 197-0833, Japan
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Fukutome Hidenobu
Fujitsu Laboratories Ltd., 50 Fuchigami, Akiruno, Tokyo 197-0833, Japan
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Inoue Fumihiko
Fujitsu Laboratories Ltd., 10-1 Morinosato-Wakamiya, Atsugi 243-01, Japan
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Arimoto Hiroshi
FUJITSU LIMITED. 50 Fuchigami, Akiruno, Tokyo 197-0833, Japan
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Suzuki Kunihiro
Fujitsu Laboratories Ltd., 10-1 Morinosato-Wakamiya, Atsugi 243-01, Japan
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Matsuda Keiko
Toray Research Center, Inc., 3-2-1 Sonoyama, Otsu 520-8567, Japan
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Yamamoto Takashi
Toray Research Center Inc., Otsu 520-8567, Japan
著作論文
- Silicon-Hydrogen Bonds in Silicon Native Oxides Formed during Wet Chemical Treatments
- Suppression of Transient Enhanced Diffusion by Local-Oxidation-Silicon-Induced Stress
- Suppression of Transient Enhanced Diffusion by LOCOS Induced Stress
- High Tilt Angle Ion Implantation into Polycrystalline Si Gates
- Analysis of Non-Uniform Boron Penetration of Nitrided Oxide in PMOSFETs Considering Two-Dimensional Nitrogen Distribution
- Boron Penetration Enhanced by Gate Ion Implantation Damage in PMOSFETs
- Hydrogen-Enhanced Boron Penetration in PMOS Devices during SiO_2 Chemical Vapor Deposition
- Hydrogen-Enhancing Boron Penetration in P-MOS Devices during SiO_2 Chemical Vapor Deposition
- Boron Diffusion in Nitrided-Oxide Gate Dielectrics Leading to High Suppression of Boron Penetration in P-MOSFETs
- Boron Diffusion in Nitrided Oxide Gate Dielectrics Leading to High Suppression of Boron Penetration in P-MOSFETs
- Thermal Budget for Fabricating a Dual Gate Deep-Submicron CMOS with Thin Pure Gate Oxide
- Thermal Budget for Fabricating A Dual Gate Deep-Submicron CMOS with Thin Pure Gate Oxide
- Electrical Properties of SiN/HfO_2/SiON Gate Stacks with High Thermal Stability(High-κ Gate Dielectrics)
- Study of L_ dependence of 2-D carrier profile in N-FET by Scanning Tunneling Microscopy
- Boron Diffusion in SiO_2 Involving High-Concentration Effects
- Boron Diffusion in SiO_2 Involving High-Concentration Effects
- Scanning Tunneling Microscopy Study of Submicron-Sized pn Junction on Si(001) Surfaces
- Direct measurement of the offset spacer effect on the carrier profiles in sub-50nm p-MOSFETs
- Sub-2nm Equivalent SiO_2 Thickness Ta_2O_5 for Gate Dielectric Using RTA+UV/O_3
- Threshold Voltage Instability of 45-nm-node Poly-Si-or FUSI-Gated SRAM Transistors Caused by Dopant Lateral Diffusion in Poly-Si
- Impact of Metal Gate/High-k Interface in Mo Metal Gated MOSFETs with HfO_2 Gate Dielectrics
- Process Integration Issues on Mo-Metal-Gated MOSFETs with HfO2 High-k Gate Dielectrics
- High Tilt Angle Ion Implantation into Polycrystalline Si Gates
- Study of Gate Length Dependence of Two-dimensional Carrier Profile in N-FET by Scanning Tunneling Microscopy
- Study of Peeling at Doped NiSi/SiO2 Interface
- Potential of and Issues with Multiple-Stressor Technology in High-Performance 45 nm Generation Devices
- Direct Measurement of Offset Spacer Effect on Carrier Profiles in Sub-50 nm p-Metal Oxide Semiconductor Field-Effect Transistors
- Thermal Budget for Fabricating a Dual Gate Deep-Submicron CMOS with Thin Pure Gate Oxide