Yamamoto Takashi | Toray Research Center Inc., Otsu 520-8567, Japan
スポンサーリンク
概要
関連著者
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Yamamoto Takashi
Toray Research Center Inc., Otsu 520-8567, Japan
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YAMAMOTO Takashi
Toray Research Center, Inc.
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SUGITA Yoshihiro
Fujitsu Laboratories Ltd.
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IZUMI Yukiko
Toray Research Center, Inc.
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Hashimoto Hideki
Toray Research Center Inc.
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Yamamoto Tetsushi
Material And Life Science Graduate School Of Engineering Osaka University
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HASHIMOTO Hideki
Toray Research Center, Inc.
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Hashimoto H
The Dept. Of Electrical & Electronic System Kanazawa University
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Yamamoto T
Toray Research Center Inc.
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Sugiyama Naoyuki
Toray Research Center Inc.
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Sugita Y
Fujitsu Laboratories Ltd.
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Hashimoto H
Toray Research Center Inc.
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Yoshikawa K
Laboratory Of Food Microbiological Engineering Faculty Of Agriculture Kinki University
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Yoshikawa Kentaro
Laboratory Of Food Microbiological Engineering Faculty Of Agriculture Kinki University
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Yoshikawa K
Department Of Bioscience Faculty Of Bioresources Mie University
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Yoshikawa Kazuhiro
Toray Research Center Inc.
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Hosoi Takuji
Department Of Electronics And Information Systems Osaka University
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SUGIYAMA Naoyuki
Toray Research Center, Inc.
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Watanabe Heiji
Department Of Material And Life Science Graduate School Of Engineering Osaka University
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Yoshikawa K
Toray Research Center Inc.
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Shimura Takayoshi
Department Of Material And Life Science Graduate School Of Engineering Osaka University
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Yoshida Kouji
Department Of Apple Research National Institute Of Fruit Tree Science
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Miyamoto Takashi
Toray Research Center Inc.
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Ogawa Shingo
Toray Research Center Inc., Otsu 520-8567, Japan
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Kita Koji
Department Of Materials Engineering School Of Engineering The University Of Tokyo
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Matsuda Keiko
Toray Res. Center Inc. Shiga Jpn
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AOYAMA Takayuki
Fujitsu Laboratories Lid.
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MIYAMOTO Takashi
Toray Research Center, Inc.
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SEKI Hirohumi
Toray Research Center, Inc.
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INOUE Minoru
TAIYO NIPPON SANSO CORPORATION
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OOSAWA Masanori
TAIYO NIPPON SANSO CORPORATION
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HASAKA Satoshi
TAIYO NIPPON SANSO CORPORATION
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IKEDA Kazuto
Fujitsu Laboratories Ltd.
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Seki Hirohumi
Toray Research Center Inc.
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Saeki Masayuki
Department Of Civil Engineering Faculty Of Science And Technology Tokyo University Of Science
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Ikeda Kazuto
Fujitsu Laboratories Limited
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Uda Tsuyoshi
Advanced Research Laboratory Hitachi Ltd.
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Hosaka Kimihiko
Fujitsu Laboratories Ltd.
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Kitano Naomu
Department of Material and Life Science, Graduate School of Engineering, Osaka University, 2-1 Yamadaoka, Suita, Osaka 565-0871, Japan
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Arimura Hiroaki
Department of Material and Life Science, Graduate School of Engineering, Osaka University, 2-1 Yamadaoka, Suita, Osaka 565-0871, Japan
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Aoyama Takayuki
Fujitsu Laboratories Ltd., 50 Fuchigami, Akiruno, Tokyo 197-0833, Japan
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Saito Masahiro
Toray Research Center, Inc., 3-2-1 Sonoyama, Otsu 520-8567, Japan
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Sugimoto Tomomi
Toray Research Center, Inc., 3-2-1 Sonoyama, Otsu 520-8567, Japan
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Hosaka Kimihiko
Fujitsu Laboratories Ltd., 50 Fuchigami, Akiruno, Tokyo 197-0833, Japan
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Ogawa Shingo
Toray Research Center, Inc., Otsu 520-8567, Japan
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Shimura Takayoshi
Department of Material and Life Science, Graduate School of Engineering, Osaka University, Suita, Osaka 565-0871, Japan
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Hashimoto Hideki
Toray Research Center, Inc., 3-7 Sonoyama 3-chome, Otsu 520-8567, Japan
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Oosawa Masanori
NIPPON SANSO Corp., 10 Okubo, Tsukuba, Ibaraki 300-2611, Japan
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Izumi Yukiko
Toray Research Center, Inc., 3-7 Sonoyama 3-chome, Otsu 520-8567, Japan
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Sugiyama Naoyuki
Toray Research Center, Inc., 3-2-1 Sonoyama, Otsu 520-8567, Japan
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Sugita Yoshihiro
Fujitsu Laboratories Ltd., 50 Huchigami, Akiruno, Tokyo 197-0833, Japan
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Yamamoto Takashi
Toray Research Center, Inc., Otsu 520-8567, Japan
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Matsuda Keiko
Toray Research Center, Inc., 3-2-1 Sonoyama, Otsu 520-8567, Japan
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Uda Tsuyoshi
AdvanceSoft Corporation, Minato, Tokyo 107-0052, Japan
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Tsuji Jun-ichi
Toray Research Center Inc., Otsu 520-8567, Japan
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Tagami Katsunori
AdvanceSoft Corporation, Minato, Tokyo 107-0052, Japan
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Kita Koji
Department of Material Engineering, The University of Tokyo, Bunkyo, Tokyo 113-8656, Japan
著作論文
- Characterization of HfO_2 Films Prepared on Various Surfaces for Gate Dielectrics(High-κ Gate Dielectrics)
- Characterization of HfO_2 Films Prepared on Various Surfaces for Gate Dielectrics
- Thermal Stability of the Yttrium Aluminate Film and the Suppression of its structural change and electrical properties degradation
- Comprehensive Study of the X-Ray Photoelectron Spectroscopy Peak Shift of La-Incorporated Hf Oxide for Gate Dielectrics
- Structural Changes of Y2O3 and La2O3 Films by Heat Treatment
- Impact of Thermally Induced Structural Changes on the Electrical Properties of TiN/HfLaSiO Gate Stacks
- Study of Peeling at Doped NiSi/SiO2 Interface