Precise Analysis of Surface Recombination Velocity in Crystalline Silicon Solar Cells Using Electroluminescence

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概要

• 論文の詳細を見る

• To increase the conversion efficiency of crystalline silicon (c-Si) solar cells, reduction of surface recombination is essentially important, and precise evaluation of surface recombination velocity becomes crucial to the development of high-efficiency cells. We propose a new evaluation technique for surface recombination velocity in crystalline Si cells using electroluminescence (EL). The intensity of EL was found to be proportional to the total number of minority carriers in the base layers of solar cells. The number of minority carriers was affected sensitively by the surface recombination; thus, we can achieve the quantitative information of the surface recombination velocity by measuring EL intensity under typical forward injection current. By comparing with the results obtained by the conventional spectral response method, the validity of the proposed precise evaluation method has been proved in cases of practical passivation processes on the rear surfaces of base layers.

• Japan Society of Applied Physicsの論文
• 2007-12-25

著者

• Fuyuki Takashi

  Graduate School Of Material Science Nara Institute Of Science And Technology

• Takahashi Yu

  Graduate School Of Information Science Nara Institute Of Science And Technology

• Yamazaki Tsutomu

  Graduate School of Materials Science, Nara Institute of Science and Technology (NAIST), 8916-5 Takayama, Ikoma, Nara 630-0192, Japan

• Yamazaki Tsutomu

  Graduate School of Materials Science, Nara Institute of Science and Technology, Ikoma, Nara 630-0192, Japan

• Uraoka Yukiharu

  Graduate School of Material Science, Nara Institute of Science and Technology, Takayama 8916-5, Ikoma, Nara 630-0192, Japan

• Kondo Hayato

  Graduate School of Materials Science, Nara Institute of Science and Technology, Ikoma, Nara 630-0192, Japan

• Takahashi Yu

  Graduate School of Materials Science, Nara Institute of Science and Technology, Ikoma, Nara 630-0192, Japan

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