Thermally Stimulated Current Analysis of Defects in Sol-Gel Derived SrTaO Thin-Film Capacitors (Special Issue : Ferroelectric Materials and Their Applications)
スポンサーリンク
概要
著者
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ECHIZEN Masahiro
Nara Institute of Science and Technology
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Ishikawa Yasuaki
Graduate School Of Materials Science Nara Institute Of Science And Technology
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Uraoka Yukiharu
Graduate School of Material Science, Nara Institute of Science and Technology, Takayama 8916-5, Ikoma, Nara 630-0192, Japan
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Lu Li
Graduate School of Materials Science, Nara Institute of Science and Technology, 8916-5 Takayama-cho, Ikoma, Nara 630-0192, Japan
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Echizen Masahiro
Graduate School of Electric and Electronic Engineering, Hachinohe Institute of Technology, 88-1 Oobiraki, Myo, Hachinohe, Aomori 031-8501, Japan
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Uchiyama Kiyoshi
Tsuruoka National College of Technology, 104 Inooka Sawada, Tsuruoka, Yamagata 997-8511, Japan
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Nishida Takashi
Graduate School of Material Science, Nara Institute of Science and Technology (NAIST), 8916-5 Takayama-cho, Ikoma, Nara 630-0192, Japan
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Shiosaki Tadashi
Shibaura Institute of Technology, Koto, Tokyo 135-8548, Japan
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