Hot-Carrier-Immunity Degradation in Metal Oxide Semiconductor Field Effect Transistors Caused by Ion-Bombardment Processes

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概要

• 論文の詳細を見る
• 社団法人応用物理学会の論文
• 1990-12-20

著者

• SHIBATA Tadashi

  Department of Physics,Faculty of Science,Osaka University

• Kotani K

  Department Of Electronic Engineering Graduate School Of Engineering Tohoku University

• Kotani Koji

  Graduate School Of Engineering Tohoku University

• Kotani Koji

  Department Of Electronic Engineering Graduate School Of Engineering Tohoku University

• Shibata Tadashi

  Department Of Information And Communication Engineering The University Of Tokyo

• Shibata T

  Univ. Tokyo Tokyo Jpn

• Shibata T

  Department Of Information And Communication Engineering The University Of Tokyo

• Ohmi Tadahiro

  Department Of Electronic Engineering Graduate School Of Engineering Tohoku University

• Shibata Tadashi

  Department Of Electrical Engineering And Information Systems School Of Engineering The University Of

• Kotani K

  Tohoku Univ. Sendai‐shi Jpn

• Ohmi Tadahiro

  Department Of Electronic Engineering

• Shibata T

  Ntt Photonics Laboratories Ntt Corporation:(present Address)ntt Science And Core Technology Group Nt

• Shibata Tadashi

  Department of Electrical Engineering and Information System, The University of Tokyo, Bunkyo, Tokyo 113-8656, Japan

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