Low Power Neuron-MOS Technology for High-Functionality Logic Gate Synthesis (Special Issue on New Concept Device and Novel Architecture LSIs)
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概要
- 論文の詳細を見る
The problem of large power dissipation in the conventional Neuron MOS (υM0S) inverter has been resolved by introducing a newly developed deep threshold υMOS inverter. This deep threshold υMOS inverter has a very simple circuit configuration composed of a υM0S inverter using deep-threshold NMOSFET and PMOSFET and two-staged CMOS inverter. Circuit configuration optimization has been conducted by HSPICE simulation. As a result, the power dissipation in the new υMOS inverter has been reduced by a factor of 1/30 as compared to conventional υMOS inverter while the delay-time has been increased only by a factor of 3. The number detector designed with new υMOS gate has 1/6 of the power-delay product and 1/3.5 of the layout area as compared to the implementation by regular CMOS gate.
- 1997-07-25
著者
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SHIBATA Tadashi
Department of Physics,Faculty of Science,Osaka University
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Kotani K
Department Of Electronic Engineering Graduate School Of Engineering Tohoku University
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Kotani Koji
Graduate School Of Engineering Tohoku University
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Shibata Tadashi
Department Of Information And Communication Engineering The University Of Tokyo
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Shibata T
Univ. Tokyo Tokyo Jpn
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Shibata T
Department Of Information And Communication Engineering The University Of Tokyo
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Kotani Koji
Laboratory For Electronic Intelligent Systems Research Institute Of Electrical Communication Tohoku
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Ohmi Tadahiro
Department Of Electronic Engineering Graduate School Of Engineering Tohoku University
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Shibata Tadashi
Department Of Electrical Engineering And Information Systems School Of Engineering The University Of
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Kotani K
Tohoku Univ. Sendai‐shi Jpn
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Ohmi Tadahiro
Department Of Electronic Engineering
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Shibata T
Ntt Photonics Laboratories Ntt Corporation:(present Address)ntt Science And Core Technology Group Nt
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KWON Ho-Yup
Department of Electronic Engineering, Tohoku University
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Shibata Tadashi
Department of Electrical Engineering and Information System, The University of Tokyo, Bunkyo, Tokyo 113-8656, Japan
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