Charging States of Si Quantum Dots as Detected by AFM/Kelvin Probe Technique
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概要
- 論文の詳細を見る
- 1999-09-20
著者
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IKEDA Mitsuhisa
Hiroshima University
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Ikeda Makoto
Faculty Of Technology Tokyo University Of Agriculture And Technology
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HIROSE Masataka
Department of Electrical Engineering, Hiroshima University
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Ikeda M
Sony Corporation Research Center
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Hirose Minoru
Process Development Division Fujitsu Limited
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Ikeda M
Tdk Electronic Device Business Group Akita Jpn
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Miyazaki S
Graduate School Of Advanced Sciences And Matters Hiroshima University
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Miyazaki Seiichi
Department Of Electrical Engineering Hiroshima University
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Yoshida E
Faculty Of Pharmaceutical Sciences Chiba University
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Yoshida Eiji
Ntt Access Network Systems Laboratories Optical Soliton Transmission Research Group
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Yoshida E
Institute Of Applied Physics University Of Tsukuba
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IKEDA Mitsuhisa
Department of Electrical Engineering, Graduate School of Advanced Sciences of Matter, Hiroshima Univ
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SHIMIZU Naoji
Department of Electrical Engineering, Hiroshima University
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YOSHIDA Eiji
Department of Electrical Engineering, Hiroshima University
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Inayoshi Muneto
Department Of Quantum Engineering School Of Engineering Nagoya Univeristy
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Miyazaki Seiichi
Faculty Of Engineering Hiroshima University
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Shimizu Naoji
Department Of Electrical Engineering Hiroshima University
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SHIMIZU Naofumi
NTT Optical Network Systems Laboratories
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Ito M
Wakayama Univ. Wakayama Jpn
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Miyazaki Seiichi
Department Of Electrical Engineering Graduate School Of Advanced Sciences And Matter Hiroshima Unive
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Shimizu N
Department Of Electrical Engineering Hiroshima University
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Ikeda M
Toshiba Corp. Kawasaki Jpn
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Miyazaki S
Department Of Electrical Engineering Hiroshima University
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Hirose M
Materials Research Center Tdk Corporation
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Miyazaki S
Graduate School Of Advanced Sciences Of Matter Hiroshima University
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Hirose Masataka
Department Of Electrical Engineering Graduate School Of Advanced Sciences Of Matter Hiroshima Univer
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Yoshida Eiji
Department Of Dentistry For Children And Disable Person Division Of Oral Functional Science Hokkaido
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Yoshida Eiji
Department Of Dental Engineering Tsurumi University School Of Dental Medicine
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Hirose Masataka
Department Of Electrical Engineering Faculty Of Engineering Hiroshima University
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Miyazaki Seiichi
Department of Electrical Engineering and Computer Science, Graduate School of Engineering, Nagoya University, Nagoya 464-8603, Japan
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