IKEDA Mitsuhisa | Hiroshima University

スポンサーリンク

概要

関連著者

もっと見る

著作論文

Random Telegraph Signals in Two-Dimensional Array of Si Quantum Dots
Formation of Pd Nanodots Induced by Remote Hydrogen Plasma and Its Application to Floating Gate MOS Memories
Formation of Pd Nanodots Induced by Remote Hydrogen Plasma and Its Application to Floating Gate MOS Memories(Session4A: Nonvolatile Memory)
Study on Collective Electron Motion in Si-Nano Dot Floating Gate MOS Capacitor(Session 9B : Nano-Scale devices and Physics)
Charging and Discharging Characteristics of Stacked Floating Gates of Silicon Quantum Dots(Nanomaterials and Quantum-Effect Devices, Fundamental and Application of Advanced Semiconductor Devices)
Memory Operation of Silicon Quantum-Dot Floating-GateMetal-Oxide-Semiconductor Field-Effect Transistors : Semiconductors
Charging States of Si Quantum Dots as Detected by AFM/Kelvin Probe Technique
Random Telegraph Signals in Two-Dimensional Array of Si Quantum Dots
Random Telegraph Signals in Two-Dimensional Array of Si Quantum Dots
Random Telegraph Signals in Two-Dimensional Array of Si Quantum Dots
Formation of Pd Nanodots Induced by Remote Hydrogen Plasma and Its Application to Floating Gate MOS Memories
Electrical Properties of Highly Crystallized Ge : H Thin Films Grown from VHF Inductively-Coupled Plasma of H_2-diluted GeH_4(Session9A: Silicon Devices IV)
Electrical Properties of Highly Crystallized Ge : H Thin Films Grown from VHF Inductively-Coupled Plasma of H_2-diluted GeH_4(Session9A: Silicon Devices IV)
Formation of Pd Nanodots Induced by Remote Hydrogen Plasma and Its Application to Floating Gate MOS Memories(Session4A: Nonvolatile Memory)
Progress on Charge Distribution in Multiply-Stacked Si Quantum Dots/SiO_2 Structure as Evaluated by AFM/KFM
Charging States of Si Quantum Dots as Detected by AFM/Kelvin Probe Technique
Study on Collective Electron Motion in Si-Nano Dot Floating Gate MOS Capacitor

もっと見る

スポンサーリンク