Evidence of Edge Conduction at Nanotube/Metal Contact in Carbon Nanotube Devices
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概要
- 論文の詳細を見る
We have investigated the current flow path between the nanotube and the contact electrode in carbon nanotube devices using multiprobe devices. The contact and channel resistances have been evaluated by two methods; transmission-line-model technique and four-probe measurement. By comparing the results, we have found that channel resistance evaluated by the four-probe measurement includes contact resistance. This indicates that the widely used four-probe measurement is not applicable to nanotube devices for the evaluation of channel resistance excluding contact resistance. This finding also implies that electron transport between the nanotube and the contact metal occurs at the edge of the contact electrode.
- Japan Society of Applied Physicsの論文
- 2007-05-25
著者
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Kishimoto Shigeru
Department Of Electrical Engineering Faculty Of Engineering Nagoya University
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Ohno Yutaka
Department Of Information Science Faculty Of Engineering Kyoto University
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Mizutani Takashi
Department Of Electrical Engineering Faculty Of Engineering Nagoya University
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Mizutani Takashi
Department of Quantum Engineering, Nagoya University, Furo-cho, Chikusa-ku, Nagoya 464-8603, Japan
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Ohno Yutaka
Department of Quantum Engineering, Nagoya University, Furo-cho, Chikusa-ku, Nagoya 464-8603, Japan
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Nosho Yosuke
Department of Quantum Engineering, Nagoya University, Furo-cho, Chikusa-ku, Nagoya 464-8603, Japan
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