Investigation of Interface Charges of High-k Gate Dielectrics and Their Effects on Carbon Nanotube Field-Effect Transistors

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概要

• 論文の詳細を見る
• 2013-02-25

著者

• MIZUTANI Takashi

  Department of Quantum Engineering, Nagoya University

• Kishimoto Shigeru

  Department Of Electrical Engineering Faculty Of Engineering Nagoya University

• Mizutani Takashi

  Department Of Electrical Engineering Faculty Of Engineering Nagoya University

• Suzuki Kosuke

  Department Of Applied Chemistry Graduate School Of Engineering The University Of Tokyo

• Ohno Yutaka

  Department of Applied Chemistry, Faculty of Engineering, Tohoku University

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