Contact Potential Measurement of Carbon Nanotube by Kelvin Probe Force Microscopy

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概要

• 論文の詳細を見る

• The contact potential of multiwalled carbon nanotubes (MWCNTs) has been successfully measured by Kelvin probe force microscopy (KFM) using a CNT tip as a potential probe. Spatial resolution was improved using a CNT tip compared with the case of using a conventional Au-coated Si tip. The contact potential along the MWCNT placed on the source and drain electrodes with bias voltage was also measured. The potential drop was observed along the MWCNT indicating that the present MWCNTs are diffusive conductors.

• 2003-04-15

著者

• Kishimoto Shigeru

  Department Of Electrical Engineering Faculty Of Engineering Nagoya University

• MIZUTANI Takasi

  Department of Quantum Engineering, Graduate School of Engineering, Nagoya University

• Maeda Chikashi

  Department Of Quantum Engineering Graduate School Of Engineering Nagoya University

• Sugai Toshiki

  Department Of Chemistry And Institute For Advanced Research Nagoya University

• Shinohara Hisanori

  Department Of Cardiology And Clinical Research

• Sugai Toshiki

  Department of Chemistry, Graduate School of Science, Nagoya University, Furo-cho, Chikusa-ku, Nagoya-shi, 464-8603, Japan

• Maeda Chikashi

  Department of Quantum Engineering, Graduate School of Engineering, Nagoya University, Furo-cho, Chikusa-ku, Nagoya-shi, 464-8603, Japan

• Kishimoto Shigeru

  Department of Quantum Engineering, Graduate School of Engineering, Nagoya University, Furo-cho, Chikusa-ku, Nagoya-shi, 464-8603, Japan

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