Measurement of Cross-Sectional Potential of InAlAs/InGaAs Layered Structures in Vacuum by Kelvin Probe Force Microscopy

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概要

• 論文の詳細を見る
• 2003-04-15

著者

• Kumada Kei-ichiro

  Department Of Quantum Engineering Nagoya University

• MIZUTANI Takashi

  Department of Quantum Engineering, Nagoya University

• Mizutani Takashi

  Department Of Health Sciences Yamanashi Medical University

• KISHIMOTO Shigeru

  Department of Quantum Engineering, Nagoya University

• Kishimoto Shigeru

  Department Of Electrical Engineering Faculty Of Engineering Nagoya University

• XIE Tengfeng

  Department of Quantum Engineering, Nagoya University

• Xie Tengfeng

  Department Of Quantum Engineering Nagoya University

• Mizutani Takashi

  Department Of Electronics Faculty Of Engineering Nagoya University

• Mizutani Takashi

  Department Of Electrical Engineering Faculty Of Engineering Nagoya University

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