Kelvin Probe Force Microscopy for Potential Distribution Measurement of Cleaved Surface of GaAs Devices

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概要

• 論文の詳細を見る
• 1996-08-26

著者

• MIZUTANI Takashi

  Department of Quantum Engineering, Nagoya University

• Mizutani Takashi

  Department Of Health Sciences Yamanashi Medical University

• KISHIMOTO Shigeru

  Department of Quantum Engineering, Nagoya University

• Arakawa Masashi

  Department Of Life Long Health Promotion College Of Education Ryukyus University

• Arakawa Masashi

  Department Of Quantum Engineering Nagoya Unviersity

• Kishimoto Shigeru

  Department Of Quantum Engineering Nagoya University

• Kishimoto Shigeru

  Department Of Electrical Engineering Faculty Of Engineering Nagoya University

• Mizutani Takashi

  Department Of Electronics Faculty Of Engineering Nagoya University

• Mizutani Takashi

  Department Of Electrical Engineering Faculty Of Engineering Nagoya University

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