Electroluminescence Measurement of n^+ Self-Alighed Gate GaAs MESFETs

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概要

• 論文の詳細を見る
• 社団法人応用物理学会の論文
• 1998-03-30

著者

• Nakata Hirofumi

  Nippon Mining & Metals Co. Ltd. Saitama Jpn

• Niwa H

  National Industrial Research Institute Of Nagoya

• MIZUTANI Takashi

  Department of Quantum Engineering, Nagoya University

• Mizutani Takashi

  Department Of Health Sciences Yamanashi Medical University

• OHNO Yutaka

  Department of Quantum Engineering, Nagoya University

• KISHIMOTO Shigeru

  Department of Quantum Engineering, Nagoya University

• Yamazaki Hiroki

  Ntt Applied Electronics Laboratories

• Kishimoto Shigeru

  Department Of Quantum Engineering Nagoya University

• Kishimoto Shigeru

  Department Of Electrical Engineering Faculty Of Engineering Nagoya University

• Ohno Yutaka

  Department Of Information Science Faculty Of Engineering Kyoto University

• Taniguchi T

  Japan Radio Co. Ltd.

• Taniguchi T

  Forest Tree Breeding Center Ibaraki Jpn

• NIWA Hiroyuki

  Department of Quantum Engineering, Nagoya University

• YAMAZAKI Hajime

  Japan Radio Co., Ltd.

• TANIGUCHI Toru

  Japan Radio Co., Ltd.

• Yamazaki H

  Japan Radio Co. Ltd.

• Nakata Hirofumi

  Nippon Mining & Metals Co. Ltd.

• Mizutani Takashi

  Department Of Electronics Faculty Of Engineering Nagoya University

• Mizutani Takashi

  Department Of Electrical Engineering Faculty Of Engineering Nagoya University

• Ohno Yutaka

  Department of Applied Chemistry, Faculty of Engineering, Tohoku University

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