Fracture of Al_χGa_<1-χ>N/GaN Heterostructure ; Compositional and Impurity Dependence : Semiconductors
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 2001-03-01
著者
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NAKAMURA Ryo
Department of Food Science ande Tecknology, School of Agriculture, Nagoya University
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Amano Hiroshi
Department of Cardiology and Pneumology, Dokkyo University School of Medicine
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Kamiyama S
Faculty Of Science And Technology Meijo University
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Kamiyama S
Silicon Systems Research Laboratories Nec Corporation
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Kamiyama Satoshi
Ulsi Device Development Laboratories Nec Corporation
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Akasaki I
Faculty Of Science And Technology Meijo University
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Akasaki I
Department Of Electrical And Electronic Engineering Faculty Of Science And Technology Meijo Universi
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Akasaki Isamu
Department Of Electrical And Electronic Engineering Meijyo University
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Akasaki Isamu
Department Of Electrical And Electronic Engineering And High-tech Research Center Meijo University
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Nakamura Ryo
Department Of Applied Biological Sciences School Of Agricultural Sciences Nagoya University
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Nakamura Ryo
Department Of Electrical & Electronic Engineering Meljo University
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IWAYA Motoaki
Department of Electrical and Electronic Engineering, Meijo University
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KAMIYAMA Satoshi
High-Tech Research Center, Meijo University
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Terao Shinji
Department Of Electrical And Electronic Engineering Meijo University
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Iwaya M
Faculty Of Science And Technology Meijo University
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Nakamura Ryo
Department Of Applied Biological Sciences School Of Agricultural Science Nagoya University
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Kamiyama Satoshi
Faculty of Science and Technology, Meijo University
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Iwaya Motoaki
Faculty of Science and Technology, Meijo University
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Akasaki Isamu
Faculty of Science and Technology, Meijo University
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Kamiyama Satoshi
Faculty of Science and Technology, the 21st Century COE Program "Nano-Factory", Meijo University
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