Analysis of Broken Symmetry in Convergent-Beam Electron Diffraction along \langle 11\bar{2}0 \rangle and \langle 1\bar{1}00 \rangle Zone-Axes of AlN for Polarity Determination
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概要
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To accurately and easily determine the polarity of AlN using transmission electron microscopy, we compare the convergent-beam electron diffraction (CBED) patterns along the widely used \langle 11\bar{2}0 \rangle and \langle 1\bar{1}00 \rangle zone-axes. For the \langle 11\bar{2}0 \rangle zone-axis, the diffraction disk of \mbi{g}= 0002 differs from that of \mbi{g}= 000\bar{2}, while for \langle 1\bar{1}00 \rangle, the diffraction disks of \mbi{g}= 0002 and 000\bar{2} are similar. The preferential clarity of these two disks is explained using Bloch-wave dynamical theory. To further support the explanation, we compare the results of GaN case. On the basis of our analysis, we conclude that the CBED patterns of the \langle 11\bar{2}0 \rangle zone-axis are more useful for accurately determining AlN polarity compared to the CBED patterns along the \langle 1\bar{1}00 \rangle zone-axis.
- 2013-08-25
著者
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Amano Hiroshi
Department of Cardiology and Pneumology, Dokkyo University School of Medicine
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TSUDA Kenji
Institute of Multidisciplinary Research for Advanced Materials (IMRAM), Tohoku University
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Imura Masataka
Optical and Electronic Materials Unit, National Institute for Materials Science (NIMS), Tsukuba, Ibaraki 305-0044, Japan
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Koide Yasuo
Optical and Electronic Materials Unit, National Institute for Materials Science (NIMS), Tsukuba, Ibaraki 305-0044, Japan
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Gautam Ujjal
New Chemistry Unit, Jawaharlal Nehru Centre for Advanced Scientific Research, Jakkur, Bangalore 560064, India
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Nakajima Kiyomi
Nanotechnology Innovation Center, NIMS, Tsukuba, Ibaraki 305-0047, Japan
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