Analysis of the Dislocation and Polarity in an AlN Layer Grown Using Ga--Al Flux
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概要
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We have developed a novel liquid-phase epitaxial (LPE) technique that uses Ga--Al flux to grow AlN layers on nitrided sapphire substrates. In this study, cross-sectional and plan-view images were taken using a transmission electron microscope. An edge dislocation was dominant in the LPE AlN layers; its density was approximately 5\times 10^{9} cm-2. Convergent-beam electron diffraction analysis revealed that the LPE layer had Al polarity, even though the nitrided sapphire layer had N polarity. The oxygen potential in the injecting N2 gas played an important role in the polarity inversion in the LPE growth.
- 2012-10-25
著者
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Fukuyama Hiroyuki
Institute Of Multidisciplimary Research For Advanced Materials Tohoku University
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Adachi Masayoshi
Institute Of Multidisciplinary Research For Advanced Materials (imram) Tohoku University
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Tanaka Akikazu
Ichikawa Research Laboratory Sumitomo Metal Mining Co. Ltd.
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TAKASUGI Mari
Institute of Multidisciplinary Research for Advanced Materials (IMRAM), Tohoku University
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MORIKAWA Daisuke
Institute of Multidisciplinary Research for Advanced Materials (IMRAM), Tohoku University
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Morikawa Daisuke
Institute of Multidisciplinary Research for Advanced Materials (IMRAM), Tohoku University, Sendai 980-8577, Japan
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TSUDA Kenji
Institute of Multidisciplinary Research for Advanced Materials (IMRAM), Tohoku University
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Tsuda Kenji
Institute of Multidisciplinary Research for Advanced Materials (IMRAM), Tohoku University, Sendai 980-8577, Japan
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Takasugi Mari
Institute of Multidisciplinary Research for Advanced Materials (IMRAM), Tohoku University, Sendai 980-8577, Japan
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Adachi Masayoshi
Institute of Multidisciplinary Research for Advanced Materials (IMRAM), Tohoku University, Sendai 980-8577, Japan
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Fukuyama Hiroyuki
Institute for Multidisciplinary Research for Advanced Materials (IMRAM), Tohoku University, Sendai 980-8577, Japan
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Tanaka Akikazu
Ichikawa Research Laboratory, Sumitomo Metal Mining Co., Ltd., Ichikawa, Chiba 272-8588, Japan
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