Fabrication and Characterization of Cross-Edge-Structured Vertical Field Emitter Arrays
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概要
- 論文の詳細を見る
New field emitter arrays (FEAs), called cross-edge-structured vertical FEAs, were fabricated and characterized. Chromium (Cr) emitters and molybdenum/Cr emitters were tested. The anode-current fraction was 50%, being improved in comparison with that of disk-edge FEAs. Threshold voltage of the anode current was a low volt-age of 25 V. From the light emission pattern, divergent angle was estimated to be 9°.
- 社団法人応用物理学会の論文
- 1994-12-30
著者
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ITOH Junji
Electrotechnical Laboratory
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KANEMARU Seigo
Electrotechnical Laboratory
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Kanemaru S
Aist Ibaraki Jpn
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Kanemaru Seigo
Nanoelectronics Research Institute Aist
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Kanemaru Seigo
Nanoelectronics Research Institute National Institute Of Advanced Industrial Science And Technology
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Kanemaru Seigo
Graduate School Of Science And Engineering Tokyo Institute Of Technology
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Kanemaru Seigo
Tsukuba Laboratory Yaskawa Electric Co. Ltd.
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Itoh J
Aist Ibaraki Jpn
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Itoh J
Nanoelectronics Research Institute Aist
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Itoh Junji
Tsukuba Laboratory Yaskawa Electric Co. Ltd.
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GAMO Hidenori
Technical Research Institute, Toppan Printing Co., Ltd.
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ISHIZAKI Mamoru
Toppan Printing Co., Ltd.,
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GAMO Hidenori
Toppan Printing Co., Ltd.,
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Ishizaki Mamoru
Toppan Printing Co. Ltd.
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Gamo Hidenori
Technical Research Institute Toppan Printing Co. Ltd.
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