Feasibility of Vacuum Microelectronics Voltage Comparator
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概要
- 論文の詳細を見る
Field-effect microtips are more coherent electron sources than hot filaments, and are well suited for electron optics applications such as low-energy electron interference. We propose to use this physical phenomenon in an integrated vacuum voltage comparator whose structure is derived from the classical Mollenstedt-type electron biprism. Our setup is separated into two independent parts, and acts both as a biprism and as a deflector for the fringe pattern. The deflection, proportional to the voltage we want to measure, is known with high precision thanks to the fine structures of the pattern. We conclude that it is possible to fabricate a device with a precision of 25 meV, a response time of 110 ps and a very high input resistance.
- 社団法人応用物理学会の論文
- 1995-11-15
著者
-
ITOH Junji
Electrotechnical Laboratory
-
KANEMARU Seigo
Electrotechnical Laboratory
-
PY Christophe
Electrotechnical Laboratory
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