Focusing Properties of a Novel Dual-Gate Edge Emitter
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概要
- 論文の詳細を見る
Field emitters are used as distributed electron sources in applications such as field emission displays(FEDs). This study analyzes the deflection and focusing properties of a novel dual-gate edge emitter. The structure considered has the edge of a thin metal layer as emitter and a defiection and focusing electrode lying in the same plane. Linear and circular emitter configurations are comparatively analyzed, the simulation work being performed with the Simion 6.0 software package. The analysis concerns electron-beam pattern, dimensions and incidence angle on the anode plane.
- 2000-10-15
著者
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Filip Valeriu
Universiiy Of Buchareg Faculty Of Physics
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Filip V
Univ. Bucharest Bucharest‐magurele Rom
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ITOH Junji
Electrotechnical Laboratory
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Itoh J
Aist Ibaraki Jpn
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Itoh J
Nanoelectronics Research Institute Aist
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Itoh Junji
Tsukuba Laboratory Yaskawa Electric Co. Ltd.
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NICOLAESCU Dan
Nanoelectronics Research Institute, AIST
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Nicolaescu D.
Nanoelectronics Research Institute Aist
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NICOLAESCU Dan
Electrotechnical laboratory
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