Visualizing the Interrelation between Surface Topograph and Surface Potential by means of a Scanning Maxwell Stress Microscope
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概要
- 論文の詳細を見る
An scanning Maxwell stress microscope (SMM) is utilized to visualize, on a microscale, the intercorrelation between the surface topograph and corresponding surface potential. It is found that the surface potential of the Fe-42Ni sample surface is weakly negatively correlated with the topographic height, while there is no correlation in the case of the Au surface used as a reference.
- 社団法人応用物理学会の論文
- 2000-09-15
著者
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ITOH Junji
Electrotechnical Laboratory
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Yamamoto Shigehiko
Institute Of Applied Physics The University Of Tsukuba:center For Tsukuba Advanced Research Alliance
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Yamamoto Shigehiko
Institute Of Applied Physics And Center For Tsukuba Advanced Research Alliance University Of Tsukuba
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Ozeki Kota
Institute Of Applied Physics The University Of Tsukuba
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Yamamoto Shigehiko
Institute of Applied Physics and Center for Tsukuba Advanced Research Alliance (TARA), University of Tsukuba, 1-1-1 Tennodai, Tsukuba, Ibaraki 305-8573, Japan
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