Microscopic Study on the Work Function Reduction Induced by Cs-Adsorption
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概要
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The effects of Cs adsorption on Pt(111) and Si(111)-($7\times 7$) surfaces have been investigated using the local tunneling barrier height (LBH) measurement with scanning tunneling microscope (STM). LBH has been evaluated from the tunneling current versus tip-sample gap distance ($I$-$z$) characteristic measurement. The histograms of LBHs obtained from the surfaces with different Cs coverages imply that the Cs adsorption effect on reduction in microscopic work function extends over a long distance beyond the classical picture. We conclude that the long-range modification in electronic structure of the substrate due to the presence of Cs atoms may be responsible for this long-range effect.
- Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文
- 2003-07-15
著者
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Yamada Yoichi
Instituate for Molecular Science of Medicine
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Sinsarp Asawin
Institute Of Applied Physics And Center For Tsukuba Advanced Research Alliance (tara) University Of
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Sinsarp Asawin
Institute of Applied Physics and Center for Tsukuba Advanced Research Alliance (TARA), University of Tsukuba, 1-1-1 Tennodai, Tsukuba, Ibaraki 305-8573, Japan
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Sasaki Masahiro
Institute of Applied Physics and Center for Tsukuba Advanced Research Alliance (TARA), University of Tsukuba, 1-1-1 Tennodai, Tsukuba, Ibaraki 305-8573, Japan
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Yamamoto Shigehiko
Institute of Applied Physics and Center for Tsukuba Advanced Research Alliance (TARA), University of Tsukuba, 1-1-1 Tennodai, Tsukuba, Ibaraki 305-8573, Japan
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