Atomistic Field Emission Distributions of Highly Oriented Pyrolytic Graphite Surfaces with Defects
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概要
- 論文の詳細を見る
Atomistic imaging of field emission current from highly oriented pyrolytic graphite (HOPG) with defects generated by ion bombardment demonstrates that the field emission current is considerably higher at the defect sites. This result suggests that the improvement of field emission characteristics upon coating the Si-field emission tip apex with carbon thin films can be explained by the defects.
- Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文
- 2009-08-25
著者
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Yamada Yoichi
Instituate for Molecular Science of Medicine
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NAGASHIMA Shinya
Institute for Drug Discovery Research, Yamanouchi Pharmaceutical Co.Ltd.,
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Sasaki Masahiro
Institute Of Applied Physics And Center For Tsukuba Advanced Research Alliance University Of Tsukuba
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Nagashima Shinya
Institute of Applied Physics, University of Tsukuba, 1-1-1 Tennodai, Tsukuba, Ibaraki 305-8573, Japan
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Ogata Satoshi
Institute of Applied Physics, University of Tsukuba, 1-1-1 Tennodai, Tsukuba, Ibaraki 305-8573, Japan
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Sasaki Masahiro
Institute of Applied Physics and Center for Tsukuba Advanced Research Alliance (TARA), University of Tsukuba, 1-1-1 Tennodai, Tsukuba, Ibaraki 305-8573, Japan
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