Local Tunneling Barrier Height Image of the Si(111)-(7×7) Surface
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概要
- 論文の詳細を見る
The local tunneling barrier height (LBH) image of Si(111)-(7 × 7) surface is compared with the corresponding scanning tunneling microscope (STM) image. At a negative sample bias voltage, while the faulted half adatoms in the 7 × 7 unit cell in the STM image are observed to be 0.24 Å higher than the unfaulted half adatoms, there exists no difference in the LBH image contrast between faulted and unfaulted halves. At a positive sample bias voltage, we observe no difference between the faulted and unfaulted halves both in the STM ana LBH images. The results suggest that there exists an unexpected mechanism which determines the STM and LBH images.
- 社団法人応用物理学会の論文
- 1998-11-15
著者
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Sasaki Masahiro
Institute Of Applied Physics University Of Tsukuba
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Yamamoto Shigehiko
Institute Of Applied Physics And Center For Tsukuba Advanced Research Alliance University Of Tsukuba
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KOMAI Masaaki
Institute of Applied Physics and Center for Tsukuba Advanced Research Alliance, University of Tsukub
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OZAWA Ryo
Institute of Applied Physics and Center for Tsukuba Advanced Research Alliance, University of Tsukub
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Ozawa Ryo
Institute Of Applied Physics And Center For Tsukuba Advanced Research Alliance University Of Tsukuba
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Sasaki Masahiro
Institute Of Applied Physics And Center For Tsukuba Advanced Research Alliance University Of Tsukuba
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Komai Masaaki
Institute Of Applied Physics And Center For Tsukuba Advanced Research Alliance University Of Tsukuba
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Sasaki Masahiro
Institute of Applied Physics and Center for Tsukuba Advanced Research Alliance (TARA), University of Tsukuba, 1-1-1 Tennodai, Tsukuba, Ibaraki 305-8573, Japan
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Yamamoto Shigehiko
Institute of Applied Physics and Center for Tsukuba Advanced Research Alliance (TARA), University of Tsukuba, 1-1-1 Tennodai, Tsukuba, Ibaraki 305-8573, Japan
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