Filip Valeriu | Universiiy Of Buchareg Faculty Of Physics
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概要
関連著者
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Filip Valeriu
Universiiy Of Buchareg Faculty Of Physics
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Filip V
Univ. Bucharest Bucharest‐magurele Rom
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Nicolaescu D.
Nanoelectronics Research Institute Aist
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Itoh J
Aist Ibaraki Jpn
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Itoh J
Nanoelectronics Research Institute Aist
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Itoh Junji
Tsukuba Laboratory Yaskawa Electric Co. Ltd.
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Nicolaescu Dan
National Institute of Advanced Industrial Science & Technology (AIST), 1-1-1 Umezono, Tsukuba, Ibara
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NICOLAESCU Dan
Nanoelectronics Research Institute, AIST
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Itoh Junji
National Institute of Advanced Industrial Science & Technology (AIST)
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ITOH Junji
Electrotechnical Laboratory
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Kanemaru Seigo
Nanoelectronics Research Institute Aist
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ITOH Junji
National Institute of Advanced Industrial Science and Technology
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Kanemaru S
Aist Ibaraki Jpn
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Kanemaru Seigo
Graduate School Of Science And Engineering Tokyo Institute Of Technology
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Kanemaru Seigo
Tsukuba Laboratory Yaskawa Electric Co. Ltd.
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Itoh Junji
Nanoelectronics Research Institute Aist
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NICOLAESCU Dan
Electrotechnical laboratory
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Kanemaru Seigo
Nanoelectronics Research Institute National Institute Of Advanced Industrial Science And Technology
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Kanemaru Seigo
Nanoelectronics Research Institute National Institute Of Advanced Industrial Science And Technology
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Kanemaru Seigo
National Institute of Advanced Industrial Science & Technology (AIST)
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Filip Lucian
University Of Bucharest Faculty Of Physics
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NAGAO Masayoshi
National Institute of Advanced Industrial Science and Technology
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KANEMARU Seigo
National Institute of Advanced Industrial Science and Technology
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Nagao M
Laboratory Of Biosignals And Response Department Of Applied Molecular Biology Kyoto University
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Okuyama Fumio
Department Of Environmental Technology Nagoya Institute Of Technology
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Nagao M
National Institute For Materials Science
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Nagao Masayoshi
Nanoelectronics Research Institute National Institute Of Advanced Industrial Science And Technology
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Filip Valeriu
Faculty of Physics, University of Bucharest, P. O. Box MG-11, Bucharest-Magurele 76900, Romania
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NICOLAESCU D.
Institute of Microtechnology (IMT)
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FILIP V.
Nagoya Institute of Technology, Department of Environmental Technology
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KLEPS I.
Institute of Microtechnology (IMT)
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Nicolaescu Dan
National Institute of Advanced Industrial Science and Technology, Electronics Lab., Tsukuba, Ibaraki 305-8568, Japan
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Nagao Masayoshi
National Institute of Advanced Industrial Science & Technology (AIST)
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Itoh Junji
National Institute of Advanced Industrial Science and Technology, Electronics Lab., Tsukuba, Ibaraki 305-8568, Japan
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Itoh Junji
Nanoelectronics Research Institute, AIST, 1-1-1 Umezono, Tsukuba, Ibaraki 305-8568, Japan
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Itoh Junji
Electrotechnical Laboratory, 1-1-4 Umezono, Tsukuba, Ibaraki 305-8568, Japan
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Itoh Junji
National Institute of Advanced Industrial Science and Technology, Electronics Lab., Tsukuba, Japan
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Sato Takanobu
Institute of Appied Physics, University of Tsukuba, 1-1-1 Tennodai, Tsukuba, Ibaraki 305-8573, Japan
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Nagao Masayoshi
Nanoelectronics Research Institute, AIST, 1-1-1 Umezono, Tsukuba, Ibaraki 305-8568, Japan
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Filip Valeriu
Faculty of Physics, University of Bucharest
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Filip Valeriu
University of Bucharest, Faculty of Physics, P.O. Box MG-11, Bucharest-Magurele 76900, Romania
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Kanemaru Seigo
National Institute of Advanced Industrial Science and Technology, Electronics Lab., Tsukuba, Ibaraki 305-8568, Japan
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Nicolaescu Dan
Nanoelectronics Research Institute, AIST, 1-1-1 Umezono, Tsukuba, Ibaraki 305-8568, Japan
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Nicolaescu Dan
National Institute of Advanced Industrial Science and Technology, Electronics Lab., Tsukuba, Japan
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Filip Valeriu
University of Bucharest, Faculty of Physics, P. O. Box MG-11, Bucharest-Magurele 76900, Romania
著作論文
- General Analytical Relationship for Electric Field of Gated Field Emitters
- Oscillator Ionization Vacuum Gauge with Field Emitters
- Dual-Gate Electron Emission Structure with Nanotube-on-Emitter for X-Ray Generation
- Emission Statistics for HfC Emitter Arrays after Residual Gas Exposure
- Device Applied Fowler-Nordheim Relationship : Semiconductors
- Electron-Beam Focusing and Deflection Properties for Misaligned Dual Gate Field Emitters
- Electron-Beam Focusing and Deflection Properties for Misaligned Dual Gate Field Emitters
- Field Emitter Magnetic Sensor with Steered Focused Electron Beam
- Electron Motion Three-Dimensional Confinement for Microelectronic Vacuum Gauges with Field Emitters
- Field Emitter Magnetic Sensor with Steered Focused Electron Beam
- Focusing Properties of Volcano-Shaped Dual-Gate Field Emitters
- Focusing Properties of Volcano-Shaped Dual-Gate Field Emitters
- Focusing Properties of a Novel Dual-Gate Edge Emitter
- Probe Anode as a Characterization Tool for Field Emission Arrays