Focusing Characteristics of Double-Gated Field-Emitter Arrays with a Lower Height of the Focusing Electrode
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概要
- 論文の詳細を見る
- 2008-05-25
著者
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NEO Yoichiro
Research Institute of Electronics, Shizuoka University
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MIMURA Hidenori
Research Institute of Electronics, Shizuoka University
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Aoki Toru
Shizuoka Univ. Hamamatsu Jpn
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Aoki Toru
Research Institute Of Electronics Shizuoka University
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Neo Yoichiro
Research Institute Of Electronics Shizuoka University
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Kanemaru Seigo
Nanoelectronics Research Institute National Institute Of Advanced Industrial Science And Technology
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SODA Takashi
Research Institute of Electronics, Shizuoka University
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TAKEDA Masafumi
Research Institute of Electronics, Shizuoka University
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NAGAO Masayoshi
National Institute of Advanced Industrial Science and Technology
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YOSHIDA Tomoya
National Institute of Advanced Industrial Science and Technology
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YASUMURO Chiaki
National Institute of Advanced Industrial Science and Technology
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KANEMARU Seigo
National Institute of Advanced Industrial Science and Technology
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SAKAI Toshikatsu
NHK Science and Technical Research Laboratories
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HAGIWARA Kei
NHK Science and Technical Research Laboratories
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SAITO Nobuo
NHK Science and Technical Research Laboratories
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Mimura Hidenori
Research Institute Of Electrical Commnication Tohoku University
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Neo Yoichiro
Reseach Institute Of Electrical Communication Tohoku University
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Hagiwara Kei
Nhk Sci. And Technol. Res. Lab. Tokyo Jpn
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Hagiwara Kei
Nhk Sci. & Technical Res. Lab. Tokyo Jpn
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Yoshida Tomoya
Nanoelectronics Research Institute National Institute Of Advanced Industrial Science And Technology
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Nagao Masayoshi
Nanoelectronics Research Institute National Institute Of Advanced Industrial Science And Technology
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Kanemaru Seigo
Nanoelectronics Research Institute National Institute Of Advanced Industrial Science And Technology
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Nagao Masayoshi
National Institute of Advanced Industrial Science & Technology (AIST)
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Kanemaru Seigo
National Institute of Advanced Industrial Science & Technology (AIST)
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Mimura Hidenori
Reseach Institute of Electrical Communication, Tohoku University,
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Aoki Toru
Reseach Institute of Electronics, Shizuoka University, Hamamatsu 432-8011 Japan
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