Atomic Number and Electron Density Measurement Using a Conventional X-ray Tube and a CdTe Detector
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概要
- 論文の詳細を見る
In order to apply the dual-energy technique to material identification, a new computed tomography scanning system was proposed using a conventional X-ray tube and a CdTe detector. This system can provide information of projection data at two distinct energy bands for scanned materials. After introducing an approximation, the measured projection data were reconstructed to obtain the distributions of the X-ray linear attenuation coefficients of the materials at two different energies. Then, the corresponding atomic number and electron density can be derived with the dual-energy X-ray computed tomography (DXCT) method adopted. By comparing the obtained results with theoretical ones, the feasibility of using this system for identifying low-$Z$ materials was demonstrated in this study.
- Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文
- 2008-09-25
著者
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Morii Hisashi
Research Institute Of Electronics Shizuoka University
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Aoki Toru
Research Institute Of Electronics Shizuoka University
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Mimura Hidenori
Research Institute Of Electrical Commnication Tohoku University
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Neo Yoichiro
Reseach Institute Of Electrical Communication Tohoku University
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Koike Akifumi
Research Institute of Electronics, Shizuoka University, Hamamatsu 432-8011, Japan
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Mimura Hidenori
Research Institute of Electronics, Shizuoka University, Hamamatsu 432-8011, Japan
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Onishi Yoshiaki
Research Institute of Electronics, Shizuoka University, Hamamatsu 432-8011, Japan
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Zou Wenjuan
Research Institute of Electronics, Shizuoka University, Hamamatsu 432-8011, Japan
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Nakashima Takuya
Research Institute of Electronics, Shizuoka University, Hamamatsu 432-8011, Japan
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Shinomiya Bunji
Research Institute of Electronics, Shizuoka University, Hamamatsu 432-8011, Japan
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Mimura Hidenori
Reseach Institute of Electrical Communication, Tohoku University,
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Morii Hisashi
Research Institute of Electronics, Shizuoka University, Hamamatsu 432-8011, Japan
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Aoki Toru
Reseach Institute of Electronics, Shizuoka University, Hamamatsu 432-8011 Japan
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Aoki Toru
Research Institute of Electronics, Shizuoka University, Hamamatsu 432-8011, Japan
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