Epitaxial Growth of Aluminum on Silicon Substrates by Metalorganic Molecular Beam Epitaxy using Dimethyl-Ethylamine Alane
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概要
- 論文の詳細を見る
In this paper, the growth process of aluminum on a silicon substrate by metalorganic molecular beam epitaxy using dimethyl-ethylamine alane has been described. The crystallographic orientation of the aluminum grains strongly depends on the substrate temperature. The epitaxial single crystalline (111) Al grains grow on a (111) Si substrate at a substrate temperature between 450 and 500°C. The bi-crystalline (110) Al grains grow on a (100) Si substrate at the substrate temperature between 350 and 450°C. For a (100) Si substrate, the orientation of Al is related to the reconstruction of the Si substrate. Furthermore, the selective growth of Al into 1.5-µm-diameter via-holes is shown to be possible.
- Publication Office, Japanese Journal of Applied Physics, Faculty of Science, University of Tokyoの論文
- 1998-05-15
著者
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Mimura Hidenori
Research Institute Of Electrical Commnication Tohoku University
-
Neo Yoichiro
Reseach Institute Of Electrical Communication Tohoku University
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Sagae Katumi
Reseach Institute Of Electrical Communication Tohoku University
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Otoda Toshihiro
Reseach Institute Of Electrical Communication Tohoku University
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Yokoo Kuniyoshi
Reseach Institute of Electrical Communication, Tohoku University,
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Sagae Katumi
Reseach Institute of Electrical Communication, Tohoku University,
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Otoda Toshihiro
Reseach Institute of Electrical Communication, Tohoku University,
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Mimura Hidenori
Reseach Institute of Electrical Communication, Tohoku University,
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