Hot Carrier Degradations of Dynamic Threshold Silicon on Insulator p-Type Metal-Oxide-Semiconductor Field Effect Transistors

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概要

• 論文の詳細を見る
• Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文
• 2004-04-15

著者

• Huang C‐y

  National Chiao Tung Univ. Hsinchu Twn

• Huang T‐y

  National Chiao Tung Univ. Hsinchu Twn

• HUANG Tiao-Yuan

  Department of Electronics Engineering, National Chiao Tung University

• Lee Y‐j

  National Chiao Tung Univ. Hsinchu Twn

• Huang Chun-yang

  Department Of Electronics Engineering And Institute Of Electronics National Chiao Tung University

• CHAO Tien-Sheng

  Department of Electrophysics, National Chiao Tung University

• LEE Yao-Jen

  Department of Electronics Engineering and Institute of Electronics, National Chiao Tung University

• LIN Horng-Chih

  National Nano Device Labs.

• LI Yiming

  National Nano Device Labs.

• Huang T-y

  Department Of Electronics Engineering And Institute Of Electronics National Chiao Tung University

• Li Y

  National Nano Device Labs.

• Lee Yao-jen

  Department Of Electronics Engineering And Institute Of Electronics National Chiao Tung University

• Lin Horng-chih

  Department Of Electronics Engineering And Institute Of Electronics National Chiao Tung University

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