CHAO Tien-Sheng | Department of Electrophysics, National Chiao Tung University
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概要
関連著者
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CHAO Tien-Sheng
Department of Electrophysics, National Chiao Tung University
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Chao Tien-sheng
Department Of Electrophysics National Chiao Tung University
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Huang T‐y
National Chiao Tung Univ. Hsinchu Twn
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HUANG Tiao-Yuan
Department of Electronics Engineering, National Chiao Tung University
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Lee Y‐j
National Chiao Tung Univ. Hsinchu Twn
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LEE Yao-Jen
Department of Electronics Engineering and Institute of Electronics, National Chiao Tung University
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Huang T-y
Department Of Electronics Engineering And Institute Of Electronics National Chiao Tung University
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Lee Yao-jen
Department Of Electronics Engineering And Institute Of Electronics National Chiao Tung University
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YANG Wen-Luh
Department of Electronic Engineering, Feng Chia University
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Yang Wen-luh
Department Of Electronic Engineering Feng Chia University
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Huang C‐y
National Chiao Tung Univ. Hsinchu Twn
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CHANG Chun-Yen
Department of Electronics Engineering, National Chiao Tung University
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LEE Yao-Jen
National Nano Device Laboratories
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Wu Shien-Yang
Taiwan Semiconductor Manufacturuing Company
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CHUU D.
Department of Electrophysics, National Chiao Tung University
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Huang Chun-yang
Department Of Electronics Engineering And Institute Of Electronics National Chiao Tung University
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LIN Horng-Chih
National Nano Device Labs.
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LI Yiming
National Nano Device Labs.
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Li Y
National Nano Device Labs.
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Chao Tien-sheng
Department Of Electrophysics National Chiao Tung University:national Nano Device Laboratories
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Lin Horng-chih
Department Of Electronics Engineering And Institute Of Electronics National Chiao Tung University
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Peng Wu-chin
Department Of Electronic Engineering Feng Chia University
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Yang Chin-hao
The Graduate Institute Of Electrical And Communications Engineering Feng Chia University
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FAN Chia-Hao
Department of Electronic Engineering, Feng Chia University
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LIN Wen-Yan
Department of Electronic Engineering, National Yunlin University of Science and Technology
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WAN Chia-Chen
Department of Electrophysics, National Chiao Tung University
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HUANG Bohr-Ran
Department of Electronic Engineering, National Yunlin University of Science and Technology Tung
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Chang C‐y
Department Of Electronics Engineering And Institute Of Electronics National Chiao Tung University
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Lin Wen-yan
Department Of Electronic Engineering National Yunlin University Of Science And Technology
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Chang S‐j
Department Of Electrical Engineering National Cheng-kung University
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Chuu D.
Department Of Electrophysics National Chiao Tung University
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Fan Chia-hao
Department Of Electronic Engineering Feng Chia University
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Wan Chia-chen
Department Of Electrophysics National Chiao Tung University
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Huang Bohr-ran
Department Of Electronic Engineering National Yunlin University Of Science And Technology Tung
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Huang Bohr-ran
Department Of Electronic Engineering National Yunlin University Of Science And Technology
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Lin Chih-yung
Taiwan Semiconductor Manufacturing Company
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LO Wen-Cheng
Department of Electronics Engineering and Institute of Electronics, National Chiao Tung University
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CHANG Sun-Jay
Taiwan Semiconductor Manufacturing Company
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CHIANG Mu-Chi
Taiwan Semiconductor Manufacturing Company
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LEE Liang
National Nano Device Laboratory
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LEE Liang-Yao
National Nano Device Laboratories
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CHEN Shine-China
Department of Electronic Engineering, Feng Chia University
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Chen Shine-china
Department Of Electronic Engineering Feng Chia University
著作論文
- Hot Carrier Degradations of Dynamic Threshold Silicon on Insulator p-Type Metal-Oxide-Semiconductor Field Effect Transistors
- The Effects of Dielectric Type and Thickness on the Characteristics of Dynamic Threshold Metal Oxide Semiconductor Transistors
- Local Strained Channel nMOSFETs by Different Poly-Si Gate and SiN Capping Layer Thicknesses : Mobility, Simulation, Size Dependence, and Hot Carrier Stress
- Systematical Study of Reliability Issues in Plasma-Nitrided and Thermally Nitrided Oxides for Advanced Dual-Gate Oxide p-Channel Metal-Oxide-Semiconductor Field-Effect Transistors
- Performance Improvement of Nickel Salicided n-Type Metal Oxide Semiconductor Field Effect Transistors by Nitrogen Implantation : Semiconductors
- Reduction of Nickel-Silicided Junction Leakage by Nitrogen Ion Implantation : Semiconductors
- Improving Electrical Characteristics of High-k NiTiO Dielectric with Nitrogen Ion Implantation