Conduction Mechanisms for Off-State Leakage Current of Schottky Barrier Thin-Film Transistors (SBTFT)
スポンサーリンク
概要
- 論文の詳細を見る
- 2001-09-25
著者
-
Huang T‐y
National Chiao Tung Univ. Hsinchu Twn
-
Tsai R‐w
National Chiao Tung Univ. Hsin‐chu Twn
-
Tsai Ren-wei
Institute Of Electronics National Chiao Tung University
-
HUANG Tiao-Yuan
Institute of Electronics, National Chiao Tung University
-
HUANG Tiao-Yuan
National Nano Device Laboratory
-
LIN Horng-Chih
National Nano Device Labs.
-
Huang T-y
Department Of Electronics Engineering And Institute Of Electronics National Chiao Tung University
-
Huang Tiao-yuan
Institute Of Electronics National Chiao Tung University:national Nano Device Laboratories
-
Huang Tiao-yuan
Institute Of Electronics National Chiao Tung University
-
Lin H‐c
National Nano Device Laboratories
-
Lin Horng-chih
National Nano Device Lab.
-
Yeh Kuan-lin
Institute Of Electronics National Chiao Tung University
-
Yeh K‐l
National Chiao Tung Univ. Hsin‐chu Twn
-
HUANG Rou-Gu
Institute of Electronics, National Chiao Tung University
-
Huang Rou-gu
Institute Of Electronics National Chiao Tung University
-
Lin Horng-chih
National Chiao Tung University
関連論文
- A New Method to Extract MOSFET Threshold Voltage, Effective Channel Length, and Channel Mobility Using S-parameter Measurement(Active Devices and Circuits)(Advances in Characterization and Measurement Technologies for Microwave and Millim
- Analysis of Narrow Width Effects in Polycrystalline Silicon Thin Film Transistors
- Ion-Implantation Treatment(Ba, Sr)TiO_3 Thin Films
- Thermal Stability of Co-Sputtered Ru-Ti Alloy Electrodes for Dynamic Random Access Memory Applications
- Rapid-Thermal-Processed BaTiO_3 Thin Films Deposited by Liquid-Source Misted Chemical Deposition
- Characteristics of Poly-Si Nanowire Thin Film Transistors with Double-Gated Structures
- Hot Carrier Degradations of Dynamic Threshold Silicon on Insulator p-Type Metal-Oxide-Semiconductor Field Effect Transistors
- Impacts of LP-SiN Capping Layer and Lateral Diffusion of interface Trap on Hot Carrier Stress of NMOSFETs
- A novel method to convert metallic-type CNTs to semiconducting-type CNT-FETs
- The Effects of Dielectric Type and Thickness on the Characteristics of Dynamic Threshold Metal Oxide Semiconductor Transistors