Study of a Dielectric Constant Due to Electronic Polarization Using a Semiempirical Molecular Orbital Method I : Semiconductors

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概要

• 論文の詳細を見る
• 社団法人応用物理学会の論文
• 2001-08-15

著者

• 新宮原 正三

  関西大学大学院工学研究科

• SAIKI Atsushi

  Graduate School of Science and Engineering, University of Toyama

• 新宮原 正三

  Hiroshima University Graduate School Of Adsm

• 新宮原 正三

  広島大学先端物質科学研究科

• YAMADA Kotaro

  Graduate School of Frontier Sciences, The University of Tokyo, Kashiwa 277-8561, Japan

• Yamada K

  Graduate School Of Advanced Science Of Matter Hiroshima University

• SAKAUE Hiroyuki

  Graduate School of Advanced Sciences of Matter, Hiroshima University

• SHINGUBARA Shoso

  Graduate School of Advanced Sciences of Matter, Hiroshima University

• TAKAHAGI Takayuki

  Graduate School of Advanced Sciences of Matter, Hiroshima University

• Takahagi Takayuki

  Hiroshima University, Graduate School of ADSM

• Shingubara Shoso

  Graduate School Of Advanced Sciences Of Matter Hiroshima University

• Sakaue H

  Hiroshima University Graduate School Of Adsm

• Saiki A

  Hiroshima Univ. Higashi‐hiroshima Jpn

• Saiki Atsushi

  Graduate School Of Advanced Science Of Matter Hiroshima University

• Sakaue Hiroyuki

  Graduate School Of Advanced Science Of Matter Hiroshima University

• Takahagi Takayuki

  Hiroshima University Graduate School Of Adsm

• Takahagi Takayuki

  Graduate School Of Advanced Science Of Matter Hiroshima University

• Yamada Kotaro

  Graduate School of Advanced Science of Matter, Hiroshima University

• Takahagi Takayuki

  Graduate School of Advance Science of Matter, Hiroshima University, 1-3 Kagamiyama, Higashi-Hiroshima, Hiroshima 739-8526, Japan

• Shingubara Shoso

  Graduate School of Advanced Science of Matter, Hiroshima University, 1-3-1 Kagamiyama, Higashi-Hiroshima 739-8530, Japan

• Shingubara Shoso

  Graduate School of Advanced Science of Matter, Hiroshima University, 1-3-1 Kagamiyama, Higashi-Hiroshima 739-8526, Japan

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