Scanning Tunneling Microscopy Observation on the Atomic Structures of Step Edges and Etch Pits on a NH_4F-Treated Si(111) Surface

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概要

• 論文の詳細を見る
• 社団法人応用物理学会の論文
• 1997-03-30

著者

• 新宮原 正三

  Hiroshima University Graduate School Of Adsm

• Shingubara Shoso

  Department of Electrical Engineering, Hiroshima University

• SAKAUE Hiroyuki

  Department of Electrical Engineering, Hiroshima University

• SAKAUE Hiroyuki

  Graduate School of Advanced Sciences of Matter, Hiroshima University

• Takahagi Takayuki

  Hiroshima University, Graduate School of ADSM

• TAKAHAGI Takayuki

  Department of Electrical Engineering, Hiroshima University

• TANAKA TOMOAKI

  Department of Clinical Endocrinology and Metabolism, Chiba University Hospital

• TAKAHASHI Eiki

  Department of Electrical Engineering, Faculty of Engineering, Hiroshima University

• Shingubara Shoso

  Department Of Applied Physics Tokyo Institute Of Technology:vlsi Research Center Toshiba Corporation

• Sakaue H

  Hiroshima University Graduate School Of Adsm

• Tanaka Tomoaki

  Department Of Clinical Endocrinology And Metabolism Chiba University Hospital

• Takahashi Eiki

  Department Of Electrical Engineering Faculty Of Engineering Hiroshima University

• Sakaue Hiroyuki

  Department Of Electrical Engineering Hiroshima University

• Takahagi Takayuki

  Hiroshima University Graduate School Of Adsm

• Takahagi Takayuki

  Department Of Electrical Engineering Faculty Of Engineering Hiroshima University

• Tanaka Tomoaki

  Department Of Agricultural Chemistry Faculty Of Agriculture Tohoku University:basic Research Laborat

• Tanaka Tomoaki

  Department Of Electrical Engineering Faculty Of Engineering Hiroshima University

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