Hot-Carrier Stress Effects on AlGaN/GaN HEMTs Employing 500℃ Oxidized Ni/Au Gate

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概要

• 論文の詳細を見る
• 2007-09-19

著者

• Han M‐k

  The Author Is With The School Of Electrical Engineering Seoul National University

• Ha Min-woo

  School Of Electrical Eng. & Computer Science #50 Seoul National University

• Choi Y‐i

  School Of Electrical Eng. & Computer Science #50 Seoul National University

• Han M‐k

  Seoul Nat'l Univ. Seoul Kor

• Han Min-Koo

  School of Electrical Engineering, Seoul National University

• Han Min-koo

  School Of Electrical Engineering Seoul National University

• Han Min-koo

  School Of Electrical Engineering And Computer Science #50 Seoul National University

• JI In-Hwan

  School of Electrical Eng., Seoul Nat'l Univ.

• CHO Kyu-Heon

  School of Electrical Eng., Seoul Nat'l Univ.

• CHOI Young-Hwan

  School of Electrical Eng., Seoul Nat'l Univ.

• LIM Jiyong

  School of Electrical Eng. & Computer Science #50, Seoul National University

• Lim Ji-yong

  School Of Electrical Eng. & Computer Science #50 Seoul National University

• Choi Yearn-ik

  School Of Electrical Eng. & Computer Science #50 Seoul National University

• Cho Kyu-heon

  School Of Electrical Eng. & Computer Science #50 Seoul National University

• Ji In-hwan

  School Of Electrical Eng. & Computer Science #50 Seoul National University

• Lim Jiyong

  School Of Electrical Eng. & Computer Science #50 Seoul National University

• Choi Young-hwan

  School Of Electrical Eng. Seoul Nat'l Univ.

• Han Min-koo

  School Of Electrical Eng. & Computer Science #50 Seoul National University

• Choi Young-hwan

  School Of Electrical Eng. & Computer Science #50 Seoul National University

• Han Min-Koo

  School of Electrical al Engineering and Computer Science #50, Seoul National University, Seoul 151-742, Korea

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