High-voltage Schottky barrier diode on silicon substrate (Special issue: Microprocesses and nanotechnology)
スポンサーリンク
概要
- 論文の詳細を見る
- Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文
著者
-
LIM Jiyong
School of Electrical Eng. & Computer Science #50, Seoul National University
-
Park Jung
School Of Electrical Engineering & Computer Science Seoul National University
-
Han Min-Koo
School of Electrical al Engineering and Computer Science #50, Seoul National University, Seoul 151-742, Korea
-
Ha Min-Woo
Compound Semiconductor Devices Research Center, Korea Electronics Technology Institute, Seongnam, Gyeonggi 463-816, Korea
-
Roh Cheong
Compound Semiconductor Devices Research Center, Korea Electronics Technology Institute, Seongnam, Gyeonggi 463-816, Korea
-
Hwang Dae
Compound Semiconductor Devices Research Center, Korea Electronics Technology Institute, Seongnam, Gyeonggi 463-816, Korea
-
Choi Hong
Compound Semiconductor Devices Research Center, Korea Electronics Technology Institute, Seongnam, Gyeonggi 463-816, Korea
-
Song Hong
Compound Semiconductor Devices Research Center, Korea Electronics Technology Institute, Seongnam, Gyeonggi 463-816, Korea
-
Lee Jun
Compound Semiconductor Devices Research Center, Korea Electronics Technology Institute, Seongnam, Gyeonggi 463-816, Korea
-
Seok Ogyun
School of Electrical Engineering and Computer Science, Seoul National University, Seoul 151-744, Korea
-
Hahn Cheol-Koo
Compound Semiconductor Devices Research Center, Korea Electronics Technology Institute, Seongnam, Gyeonggi 463-816, Korea
関連論文
- Electrical Properties of Electron-Beam Exposed Silicon Dioxides and Their Application to Nano-devices
- A New Recessed Gate-Line Employing Air-Gap Gate-Data Line Inter-Crossover to Reduce Signal Delay for AMLCD (情報ディスプレイ--The 6th Asian Symposium on Information Display & Exhibition)
- A New Recessed Gate-Line Employing Air-gap Gate-Data Line Inter-Crossover to Reduce Signal Delay for AMLCD
- New Excimer Laser Recrystallization of Poly-Si for Effective Grain Growth and Grain Boundary Arrangement
- New Thin Film Transistor with Poly-Si Active Layer Consisting of Enlarged Grain Structure
- Excimer-Laser-Induced In-Situ Fluorine Passivation Effects on Polycrystalline Silicon Thin Film Transistors
- Excimer-Laser-Induced Fluorine Passivation Effects on Electrical Characteristics and Stability of Poly-Si TFTs
- Gate-Overlapped Lightly Doped Drain Poly-Si Thin Film Transistors by Employing Low-Temperature Doping Techniques
- Fabrication of Gate Overlapped-LDD poly-Si TFT for Large Area AMLCD
- New Poly-Si Thin Film Transistors with a-Si Channel Region Designed to Reduce the Leakage Current
- A Novel LDD-Structured Poly-Si Thin Film Transistors with High ON/OFF Ratio
- Excimer Laser Induced Crystallization of Polycrystalline Silicon Films by Adding Oxygen
- Pixel Design for TFT-LCD with Double Gate Poly-Si TFT and Double Layer Storage Capacitor
- New Poly-Silicon TFT Partially Crystallized by Excimer Laser Irradiation through ITO Gate
- New Poly-Silicon TFT Partially Crystallized by Excimer Laser Irradiation through ITO Gate
- A New Insulated Gate Bipolar Transistor Structure employing an Embedded Over-current Protection Device
- Increase of Breakdown Voltage in AlGaN/GaN HEMTs by Employing As+ Ion Implantation on SiO_2 Passivation Layer
- Hot-Carrier Stress Effects on AlGaN/GaN HEMTs Employing 500℃ Oxidized Ni/Au Gate
- A New Field Plate Structure for Suppression of Leakage Current of AlGaN/GaN HEMTs
- SiO_2 Passivation Effects on the Leakage Current in Dual-Gate AlGaN/GaN High Electron Mobility Transistors
- A New SOI Lateral Insulated Gate Bipolar Transistor and Lateral Diode employing the Separated Schottky Anode for a Power Integrated Circuit
- A New 1200V PT-IGBT with Protection Circuit employing the Lateral IGBT and Floating p-well Voltage Sensing Scheme
- A New Protection Circuit for improving Short-Circuit Withstanding Capability of Lateral Emitter Switched Thyristor (LEST)
- Experimental study on Improving Unclamped Inductive Switching Characteristics of the New Power MOSFET Employing Deep Body Contact
- Suppression of the leakage current of a Ni/Au Schottky Barrier Diode fabricated on AlGaN/GaN hetero-structure by oxidation
- A New ICP-CVD SiO_2 Passivation for High Voltage Switching AlGaN/GaN HFETs
- A New Conductivity Modulated LDMOSFET Employing Buried P Region and P^+ Drain
- A Dual Gate AlGaN/GaN HEMT For High Voltage Switching Applications
- Pulsed Current-Voltage-Temperature Characteristics of AlGaN/GaN High Electron Mobility Transistor under Isothermal Conditions
- Dual-Gate Shorted Anode SOI Lateral Insulated Gate Bipolar Transistor Suppressing the Snap-Back
- A New Dual-Gate SOI LIGBT with the Shorted Anode
- A Insitu Vacuum Encapsulated Novel Lateral Field Emitter Triode with Titanium Cathode
- A Comparison of Poly Silicon and Titanium Polycide for Field Emission Tip
- A Novel Bottom-Gate Poly-Si Thin Film Transistors with High ON/OFF Current Ratio
- A New Junction Termination in Power Semiconductor Devices employing Trench
- A New Lateral Dual-Gate Thyristor with Current Saturation
- A Novel SOI Carrier-Inducing Barrier-Controlled LIGBT with High Switching Speed
- Bipolar-Field-Effect-Transistor Hybrid-Mode Operation of Lateral Silicon-on-Insulator Bipolar Mode Field Effect Transistor with Improved Current Gain
- A Hybrid Lateral SOI BMFET with High Current Gain
- Multi channel AlGaN/GaN HEMTs for high breakdown voltage and low leakage current
- Suppression of Current-Induced Degradation in Laser-Crystallized Polycrystalline Silicon Films by Adding Oxygen
- The effect of interface trap charges on poly-Si TFT
- The effect of interface trap charges on poly-Si TFT
- A New Lateral Dual-Gate Thyristor with Current Saturation
- A New Junction Termination in Power Semiconductor Devices employing Trench
- A New Gate-Overlapped LDD Poly-Si Thin Film Transistors
- Intermixing Characteristics of Strained-InGaAs/InGaAsP Multiple Quantum Well Structure Using Impurity-Free Vacancy Diffusion
- New Recursive Least Squares Algorithms without Using the Initial Information
- High-voltage Schottky barrier diode on silicon substrate (Special issue: Microprocesses and nanotechnology)
- Trench Insulated Gate Bipolar Transistor for the Improved Short Circuit Capability Employing Curved Junction and Wide Cell Pitch
- Bias-Temperature- and Light-Induced Instability in Short-Channel ($L = 1.5$ μm) p-Type Polycrystalline Silicon Thin-Film Transistors on Glass Substrates
- Suppression of Leakage Current of Ni/Au Schottky Barrier Diode Fabricated on AlGaN/GaN Heterostructure by Oxidation
- New Inductively Coupled Plasma–Chemical Vapor Deposition SiO2 Passivation for High-Voltage Switching AlGaN/GaN Heterostructure Field-Effect Transistors
- AlGaN/GaN High-Electron-Mobility Transistor Employing an Additional Gate for High-Voltage Switching Applications
- Nanocrystalline Silicon Thin-Film Transistor Fabricated without Substrate Heating for Flexible Display
- A New Poly-Si TFT Employing Air-Cavities at the Edge of Gate Oxide Reducing Gate Induced Drain Leakage Current
- Effect of O2 Gas during Inductively Coupled O2/Cl2 Plasma Etching of Mo and HfO2 for Gate Stack Patterning
- A New 1200 V Punch Through-Insulated Gate Bipolar Transistor with Protection Circuit Employing Lateral Insulated Gate Bipolar Transistor and Floating p-Well Voltage Sensing Scheme
- A New 600 V Punch Through-Insulated Gate Bipolar Transistor with the Monolithic Fault Protection Circuit Using the Floating p-Well Voltage Detection
- Active-Matrix Organic Light Emission Diode Pixel Circuit for Suppressing and Compensating for the Threshold Voltage Degradation of Hydrogenated Amorphous Silicon Thin Film Transistors
- Effect of Ga Doping on Transparent and Conductive Al-Doped ZnO Films Prepared Using Magnetron Cosputtering
- Effects of Annealing Temperature on Electrical Characteristics of Solution-Processed Zinc Tin Oxide Thin-Film Transistors
- Hot-Carrier Effects in Short Channel (L = 1.5μm) p-Type Polycrystalline Silicon Thin-Film Transistors
- Novel F-Shaped Triple-Gate Structure for Suppression of Kink Effect and Improvement of Hot Carrier Reliability in Low-Temperature Polycrystalline Silicon Thin-Film Transistor
- Novel L-Shaped Dual-Gate Structure of Polycrystalline Silicon Thin-Film Transistors for the Reduction of the Kink Current in Sequential Lateral Solidification or Continuous Wave Laser Method
- A Substrate Bias Effect on Recovery of the Threshold Voltage Shift of Amorphous Silicon Thin-Film Transistors
- New Current-Scaling Pixel Circuit Compensating Non uniform Electrical Characteristics for Active Matrix Organic Light Emitting Diode
- Hydrogenated Microcrystalline Silicon Film Growth by Inductively Coupled Plasma–Chemical Vapor Deposition on ZrO2 Gate Dielectric for Thin Film Transistors
- An Improved Junction Termination Design Employing Shallow Trenches and Field Limiting Rings for Power Devices
- Positive Shift of Threshold Voltage in Short-Channel ($L = 1.5$ μm) p-Type Polycrystalline Silicon Thin-Film Transistor under Off-State Bias Stress
- New Fraction Time Annealing Method For Improving Organic Light Emitting Diode Current Stability of Hydorgenated Amorphous Silicon Thin-Film Transistor Based Active Matrix Organic Light Emitting Didode Backplane
- Effect of Dynamic Bias Stress in Short-Channel (L=1.5 μm) p-Type Polycrystalline Silicon Thin-Film Transistors
- Selective Growth of GaN Rods on the Apex of GaN Pyramids by Metal Organic Vapor Phase Epitaxy
- Kink Suppression Improvement of Polycrystalline Silicon Thin-Film Transistors Employing Asymmetric Dual-Gate Design
- Time-Domain Quaternary-Weighted Pulse Width Modulation Driving Method for Active Matrix Organic Light-Emitting Diode Displays
- Shape and Interband Transition Behavior of InAs Quantum Dots Dependent on Number of Stacking Cycles
- High-Aperture Pixel Design Employing $V_{\text{DD}}$ Line Elimination for Active Matrix Organic Light Emitting Diode Display
- Electrostatic Discharge Effects on AlGaN/GaN High Electron Mobility Transistors on Sapphire Substrates
- A New Trenched Source Power MOSFET Improving Avalanche Energy
- Touch-Sensitive Active-Matrix Display with Liquid-Crystal Capacitance Detector Arrays
- Control of Polymer Structures in Phase-Separated Liquid Crystal-Polymer Composite Systems
- A New Silicon-on-Insulator Lateral Insulated Gate Bipolar Transistor and Lateral Diode Employing the Separated Schottky Anode for a Power Integrated Circuit
- Lateral Diffusion of Phosphorous Induced by Excimer Laser Irradiation of Silicon Thin Film for Formation of Gradual Lightly Doped Region in Polycrystalline Silicon Thin Film Transistors
- The Space Charge Effect on the Discharge Current in Cross-Linked Polyethylene under High AC Voltages
- Second Breakdown of 18V Grounded Gate NMOS induced by the Kirk Effect under Electrostatic Discharge
- New Field Plate Structure for Suppression of Leakage Current of AlGaN/GaN High Electron Mobility Transistors
- A New Protective Circuit to Improve Short-Circuit Withstanding Capability of a Lateral Emitter Switched Thyristor
- Low-Voltage Driven P-Type Polycrystalline Silicon Thin-Film Transistor Integrated Gate Driver Circuits for Low-Cost Chip-on-Glass Panel
- SiO2 Passivation Effects on the Leakage Current in AlGaN/GaN High-Electron-Mobility Transistors Employing Additional Schottky Gate
- Experimental Study on Improving Unclamped Inductive Switching Characteristics of the New Power Metal Oxide Semiconductor Field Effect Transistor Employing Deep Body Contact
- Suppression of Leakage Current in Solid-Phase Crystallization Silicon Thin-Film Transistors Employing Off-State-Bias Annealing
- A Novel LDD-Structured Poly-Si Thin Film Transistors with High ON/OFF Ratio
- New Excimer Laser Recrystallization of Poly-Si for Effective Grain Growth and Grain Boundary Arrangement
- A New Poly-Si Thin Film Transistors with Partial Amorphous Si Channel