Effects of Annealing Temperature on Electrical Characteristics of Solution-Processed Zinc Tin Oxide Thin-Film Transistors

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概要

• 論文の詳細を見る

著者

• Kwon Jang-yeon

  School Of Materials Science And Engineering Seoul National University

• Kim Yong-Hoon

  Flexible Display Research Center, Korea Electronics Technology Institute, Seongnam, Gyeonggi 463-816, Korea

• Kim Yong-Jin

  School of Electrical Engineering and Computer Science, Seoul National University, 599 Gwanak-ro, Sinlim-dong, Gwanak-gu, Seoul 151-742, Korea

• Han Min-Koo

  School of Electrical al Engineering and Computer Science #50, Seoul National University, Seoul 151-742, Korea

• Lee Jeong-Soo

  School of Electrical Engineering and Computer Science, Seoul National University, Seoul 151-742, Korea

• Lee Yong-Uk

  School of Electrical Engineering and Computer Science, Seoul National University, Seoul 151-742, Korea

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