Hydrogen Passivation on the Grain Boundary and Intragranular Defects in Various Polysilicon Thin Film Transistors

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概要

• 論文の詳細を見る
• 1995-08-21

著者

• Choi Hong-seok

  School Of Electrical Engineering Seoul National University

• Han M‐k

  The Author Is With The School Of Electrical Engineering Seoul National University

• Choi K‐y

  Seoul National Univ. Seoul Kor

• Han M‐k

  Seoul Nat'l Univ. Seoul Kor

• Yoo Juhn-suk

  The Author Is With The School Of Electrical Engineering Seoul National University

• Han Min-koo

  Department Of Electrical Engineering Seoul National University

• CHOI Kwon-Young

  Department of Electrical Engineering, Seoul National University

• YOO Juhn-Suk

  Department of Electrical Engineering, Seoul National University

• KIM Yong-Sang

  Department of Electrical Engineering, Myongji University

• CHOI Hong-seok

  Department of Electrical Engineering, Seoul National University

• LIM In-Gon

  LG Electronics Research Center

• Kim Yong-sang

  Department Of Electrical Engineering Myongji University

• Choi Hong-seok

  Department Of Electrical Engineering And Computer Science Korea Advanced Institute Of Science And Te

• Choi Kwon-young

  Department Of Electrical Engineering Seoul National University

• Yoo Juhn-suk

  Department Of Electrical Engineering Seoul National University

• Yoo Juhn

  School Of Electrical Engineeririg Seoul National University

• Han Min-Koo

  Department of Electrical Engineering and Computer Science, Seoul National University, 599 Gwanak-ro, Gwanak-gu, Seoul 151-744, Korea

• Kim Yong-Sang

  Department of Electrical Engineering and Nano-Bio Reaserch Center, Myongji University, Gyeonggi 449-728, Korea

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