YOO Juhn-Suk | Department of Electrical Engineering, Seoul National University
スポンサーリンク
概要
関連著者
-
Han M‐k
The Author Is With The School Of Electrical Engineering Seoul National University
-
Choi K‐y
Seoul National Univ. Seoul Kor
-
Han M‐k
Seoul Nat'l Univ. Seoul Kor
-
Yoo Juhn-suk
The Author Is With The School Of Electrical Engineering Seoul National University
-
Han Min-koo
Department Of Electrical Engineering Seoul National University
-
CHOI Kwon-Young
Department of Electrical Engineering, Seoul National University
-
YOO Juhn-Suk
Department of Electrical Engineering, Seoul National University
-
KIM Yong-Sang
Department of Electrical Engineering, Myongji University
-
Kim Yong-sang
Department Of Electrical Engineering Myongji University
-
Choi Kwon-young
Department Of Electrical Engineering Seoul National University
-
Yoo Juhn-suk
Department Of Electrical Engineering Seoul National University
-
Yoo Juhn
School Of Electrical Engineeririg Seoul National University
-
Han Min-Koo
Department of Electrical Engineering and Computer Science, Seoul National University, 599 Gwanak-ro, Gwanak-gu, Seoul 151-744, Korea
-
Kim Yong-Sang
Department of Electrical Engineering and Nano-Bio Reaserch Center, Myongji University, Gyeonggi 449-728, Korea
-
Choi Hong-seok
School Of Electrical Engineering Seoul National University
-
CHOI Hong-seok
Department of Electrical Engineering, Seoul National University
-
LIM In-Gon
LG Electronics Research Center
-
Choi Hong-seok
Department Of Electrical Engineering And Computer Science Korea Advanced Institute Of Science And Te
著作論文
- Hydrogen Passivation on the Grain Boundary and Intragranular Defects in Various Polysilicon Thin-Film Taransistors
- Hydrogen Passivation on the Grain Boundary and Intragranular Defects in Various Polysilicon Thin Film Transistors