Han M‐k | Seoul Nat'l Univ. Seoul Kor
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概要
関連著者
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Han M‐k
Seoul Nat'l Univ. Seoul Kor
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Han M‐k
The Author Is With The School Of Electrical Engineering Seoul National University
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Han Min-Koo
School of Electrical Engineering, Seoul National University
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Han Min-koo
School Of Electrical Eng. & Computer Science #50 Seoul National University
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Han Min-koo
School Of Electrical Engineering And Computer Science #50 Seoul National University
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Han Min-Koo
School of Electrical al Engineering and Computer Science #50, Seoul National University, Seoul 151-742, Korea
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Ha Min-woo
School Of Electrical Eng. & Computer Science #50 Seoul National University
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Choi Y‐i
School Of Electrical Eng. & Computer Science #50 Seoul National University
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Choi Young-hwan
School Of Electrical Eng. Seoul Nat'l Univ.
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Choi Yearn-ik
School Of Electrical Eng. & Computer Science #50 Seoul National University
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Jeon J‐h
Seoul National Univ. Seoul Kor
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Jun Jae-hong
Department Of Electrical Engineering Seoul National University
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Jun Jae
School Of Electrical Engineeririg Seoul National University
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Park C‐m
Samsung Electronics Co. Ltd. Kyungki‐do Kor
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JEON Jae-Hong
The author is with the School of Electrical Engineering, Seoul National University
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Park Cheol-min
School Of Electrical Engineering Seoul National University
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Han Min-koo
School Of Electrical Engineering Seoul National University
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Yoo Juhn-suk
The Author Is With The School Of Electrical Engineering Seoul National University
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Yoo Juhn-suk
Department Of Electrical Engineering Seoul National University
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Yoo Juhn
School Of Electrical Engineeririg Seoul National University
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Choi K‐y
Seoul National Univ. Seoul Kor
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CHOI Yearn-Ik
School of Electrical Eng. & Computer Science #50, Seoul National University
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Min B‐h
School Of Electrical Engineeririg Seoul National University
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Jeon Jae-Hong
School of Electrical Engineering, Seoul National University
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CHOI Young-Hwan
School of Electrical Eng., Seoul Nat'l Univ.
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SEO Kwang-Seok
School of Electrical Engineering, Seoul National University
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Seo Kwang-seok
Seoul Nat'l Univ. Eecs/ee
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Choi Young-hwan
School Of Electrical Eng. & Computer Science #50 Seoul National University
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Choi Hong-seok
School Of Electrical Engineering Seoul National University
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JI In-Hwan
School of Electrical Eng., Seoul Nat'l Univ.
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HER Jin-Cherl
School of Electrical Engineering, Seoul National University
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Choi Hong-seok
Department Of Electrical Engineering And Computer Science Korea Advanced Institute Of Science And Te
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Seo K‐s
Seoul Nat'l Univ. Eecs/ee
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Seo Kwang-seok
School Of Electrical Engineering And Computer Science Seoul National University
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Seo Kwang-Seok
School of Electrical Engineering #50, Seoul National University, Shinlim-dong, Gwanak-gu, Seoul 151-742, Korea
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Choi Kwon-Young
School of Chemical and Biological Engineering, Institute of Molecular Biology and Genetics, Institut
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Lee Min-Cheol
School of Electrical Engineering, Seoul National University
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PARK Kee-Chan
School of Electrical Engineering, Seoul National University
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PARK Cheol-Min
School of Electrical Engineering, Seoul National University
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Park K‐c
Lg Electronics Inc. Seoul Kor
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Han Min-koo
Department Of Electrical Engineering Seoul National University
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Choi Kwon-young
School Of Chemical And Biological Engineering Institute Of Molecular Biology And Genetics Institute
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Park Kee-chan
School Of E1ectrical Engineering Seoul National University
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Ji In-hwan
School Of Electrical Eng. & Computer Science #50 Seoul National University
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Lim Jiyong
School Of Electrical Eng. & Computer Science #50 Seoul National University
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Her Jin-cherl
Seoul Nat'l Univ. Eecs/ee
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Han Min-Koo
Department of Electrical Engineering and Computer Science, Seoul National University, 599 Gwanak-ro, Gwanak-gu, Seoul 151-744, Korea
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Kim Chun-hong
School Of Electrical Engineering Seoul National University
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Kim Cheon-hong
School Of Electrical Engineering Seoul National University
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LEE Seung-Chul
School of Electrical Engineering (#50), Seoul National University
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Lee Seung-chul
School Of Electrical Engineering #50 Seoul National University
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Her Jin-Cherl
School of Electrical Engineering #50, Seoul National University, Shinlim-dong, Gwanak-gu, Seoul 151-742, Korea
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Kim Dong-hyun
Td Team R&d Center Samsung Electronics Co.ltd.
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Kim Doo-young
School Of Electrical Eng. Seoul National Univ.
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YOO Juhn-Suk
School of Electrical Engineering, Seoul National University
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Lee M‐c
Seoul National Univ. Seoul Kor
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Lim Ji-yong
School Of Electrical Eng. & Computer Science #50 Seoul National University
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Kim D‐y
Department Of Veterinary Pathology College Of Veterinary Medicine Seoul National University And Scho
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Kim Yong-sang
Department Of Electrical Engineering Myongji University
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Byeon Dae-seok
School Of Electrical Engineering Seoul National University
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Lee Seung-Chul
School of Electrical Eng., Seoul Nat'l Univ., Shinlim-dong, Kwanak-ku, #50, 301-1115, Seoul 151-742, Korea
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Lee B‐h
Inha Univ. Inchon Kor
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KIM Cheon-Hong
School of Electrical Engineering, Seoul National University
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PARK Cheol-Min
Room 1102, School of Electrical Engineering, Seoul National University
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YOO Juhn-Suk
Room 1102, School of Electrical Engineering, Seoul National University
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HAN Min-Koo
Room 1102, School of Electrical Engineering, Seoul National University
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LIM Jiyong
School of Electrical Eng. & Computer Science #50, Seoul National University
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JEON Byung-Chul
School of Electrical Eng. & Computer Science #50, Seoul National University
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CHOI Yearn-Ik
College of Electronics Eng., Ajou University
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BYEON Dae-Seok
School of Electrical Eng., Seoul Nat'l University
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Park Cheol-min
Room 1102 School Of Electrical Engineering Seoul National University
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Kim Soo-seong
School Of Electrical Eng. & Computer Science #50 Seoul National University
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Lee Min-cheol
School Of Electrical Engineering Seoul National University
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Jeon Byung-chul
School Of Electrical Eng. & Computer Science #50 Seoul National University
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Han Min-koo
School Of Electrical Eng. Seoul Nat'l Univ.
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MIN Byung-Hyuk
Room 1102, School of Electrical Engineering, Seoul National University
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Oh J‐k
Seoul National Univ. Seoul Kor
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Min Byung-hyuk
Department Of Electrical Engineering Seoul National University
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CHO Kyu-Heon
School of Electrical Eng., Seoul Nat'l Univ.
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KIM Soo-Seong
Fairchild Semiconductor
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OH Jae-Keun
School of Electrical Engineering #50, Seoul National University
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Kim Sam-dong
Millimeter-wave Innovation Technology Research Center (mint) Dongguk University
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Kim S‐d
Seoul National Univ. Seoul Kor
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PARK Cheol-Min
Dept. of Electrical Engineering, Seoul National University
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MIN Byung-Hyuk
Dept. of Electrical Engineering, Seoul National University
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HAN Min-Koo
Dept. of Electrical Engineering, Seoul National University
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LEE Byeong-Hoon
School of Electrical Eng., Seoul Nat'l University
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LIM Moo-Sup
School of Electrical Eng., Seoul Nat'l University
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CHOI Kwon-Young
Department of Electrical Engineering, Seoul National University
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KIM Yong-Sang
Department of Electrical Engineering, Myongji University
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Choi Kwon-young
Department Of Electrical Engineering Seoul National University
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Oh Jae-keun
School Of Electrical Eng. #50 Seoul National University
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Cho Kyu-heon
School Of Electrical Eng. & Computer Science #50 Seoul National University
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Kim Yong-Sang
Department of Electrical Engineering and Nano-Bio Reaserch Center, Myongji University, Gyeonggi 449-728, Korea
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Park Jin-Woo
School of Electrical Engineering, Seoul National University
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JEON Jae-Hong
Room 1102, School of Electrical Engineering, Seoul National University
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JUN Jae-Hong
School of Electrical Engineering, Seoul National University
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MIN Byung-Hyuk
School of Electrical Engineering, Seoul National University
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Lee Y‐s
Yonsei Univ. Seoul Kor
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Park Jin-woo
School Of Electrical Engineering Seoul National University
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Park Jin-woo
Department Of Biochemistry Chonbuk National University Medical School And Institute For Medical Scie
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Park Jin-woo
Department Of Plant Pathology National Institute Of Agricultural Science And Technology Korea
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Park Cheol-min
Department Of Electrical Engineering University Of California
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Lee J‐h
School Of Electrical Engineering #032 Seoul National University
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OH Kwang-Hoon
Fairchild Semiconductor
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YUN Chong-Man
Fairchild Semiconductor
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KIM Soo-Seong
School of Electrical Eng. & Computer Science #50, Seoul National University
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OH Jae-Eung
Hanyang Univ. EECS/EE
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LEE Kang-Min
School of Electrical Engineering, Seoul National University
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JANG Keun-Ho
Department of Electrical Engineering, Seoul National University
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Lee Won-oh
School Of Electrical Eng. Seoul Nat'l University
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Lee J‐h
Division Of Materials Science And Engineering Korea University
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LEE Jae-Hoon
School of Electrical Engineering & Computer Science Kyungpook National University
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YOO Juhn-Suk
Department of Electrical Engineering, Seoul National University
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CHOI Yearn-Ik
Department of Electrical Science, Korea Advanced Institute of Science and Technology
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LEE You-Sang
School of Electrical Eng., Seoul National Univ.
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Lee You-sang
School Of Electrical Engineering Seoul National University
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Lee Kang-min
Seoul Nat'l Univ. Eecs/ee
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Choi Yearn-ik
Department Of Electrical Science Korea Advanced Institute Of Science And Technology
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Moon Kook
School Of Electrical Engineering Seoul National University
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Lee Min-Chul
School of Electrical Engineering, Seoul National University
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Lee Jin-hee
School Of Electrical Engineering Seoul National University
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Jang Keun-ho
Department Of Electrical Engineering Seoul National University
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Jun Jae-hong
School Of Electrical Engineering Seoul National University
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Choi Yearn-Ik
Department of Electrical and Computer Engineering, Ajou University, Suwon 443-749, Korea
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Kim C‐h
Korea Advanced Inst. Sci. And Technol. Daejeon Kor
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Lee Seung-chul
Fairchild Semiconductor Dodang-dong
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Jo William
Department Of Physics Ewha Womans University
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LEE Min-Cheol
The author is with the School of Electrical Engineering, Seoul National University
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YOO Juhn-Suk
The author is with the School of Electrical Engineering, Seoul National University
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HAN Min-Koo
The author is with the School of Electrical Engineering, Seoul National University
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KIM Cheon-Hong
Room 1102, School of Electrical Engineering, Seoul National University
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CHOI Hong-Seok
Room 1102, School of Electrical Engineering, Seoul National University
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Bae Byung-Sung
Samsung Electronics Co. Ltd
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Yoo Juhn
School of Electrical Engineeririg, Seoul National University
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Jun Jae
School of Electrical Engineeririg, Seoul National University
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Han Min
School of Electrical Engineeririg, Seoul National University
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MOON Dae-Kyu
LG R&D Center
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Kim C‐h
Seoul National Univ. Seoul Kor
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Lee S‐k
Lg Chem Ltd. Daejeon Kor
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Han Min
School Of Electrical Engineering Seoul National University
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LEE Jihye
Department of Physics, Ewha Womans University
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LIM Ji-Yong
School of Electrical Engineering (#50), Seoul National University
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HER Jin-Cherl
Seoul Nat'l Univ., EECS/EE
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LEE Kang-Min
Seoul Nat'l Univ., EECS/EE
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LEE Seung-Chul
Seoul Nat'l Univ., EECS/EE
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HAN Min-Koo
Seoul Nat'l Univ., EECS/EE
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SEO Kwang-Seok
Seoul Nat'l Univ., EECS/EE
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Oh Jae-eung
School Of Mechanical Engineering Hanyang University
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LEE Jae-Hak
WAVICS Inc.
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JUN Jae-Hong
Department of Electrical Engineering, Seoul National University
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JANG Keun-Ho
Dept. of Electrical Engineering, Seoul National University
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JUN Jae-Hong
Dept. of Electrical Engineering, Seoul National University
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BAE Byung-Seong
Special Marketing Team/Poly PJT, Samsung Electronics Co.
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KIM Han-Soo
Department of Materials Science & Engineering, Pohang University of Science & Technology (POSTECH)
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PARK Jung-Eon
School of Electrical Eng., Seoul Nat'l University
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Lee S‐k
Korea Advanced Inst. Sci. And Technol. Taejon Kor
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CHOI Hong-seok
Department of Electrical Engineering, Seoul National University
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LIM In-Gon
LG Electronics Research Center
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LEE Seong-Kyu
Department of Electrical Engineering, Seoul National University
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Lee Seong-kyu
Department Of Electrical Engineering Seoul National University
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CHOI Hyung-Bae
School of Electrical Engineering, Seoul National University
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CHUN Jung-Hoon
School of of Electrical Eng., Seoul Nat'l Univ.
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KIM Seong-Dong
School of Electrical Engineering, Seoul National University
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KIM Seong-Dong
System IC R&D Lab., Hyundai Electronics Industries Co., Ltd.
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Lee Min-cheol
The Author Is With The School Of Electrical Engineering Seoul National University
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HAN Sang-Myeon
School of Electrical Engineering, Seoul National University
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Han Min-koo
The Author Is With The School Of Electrical Engineering Seoul National University
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Choi Hyung-bae
School Of Electrical Engineering Seoul National University
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Chun Jung-hoon
School Of Of Electrical Eng. Seoul Nat'l Univ.
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Oh Jae-eung
School Of Electrical And Computer Engineering Hanyang University
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Lee Jae-hak
Theleds Co. Ltd.
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Moon Dae-kyu
Lg R&d Center
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Bae Byung-seong
Special Marketing Team/poly Pjt Samsung Electronics Co.
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Lee Jihye
Department Of Pharmacy Daegu Catholic Univ. Medical Center
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Lee Jihye
Department Of Physics Ewha Womans University
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Lee Jae-hak
Wavics Co. Ltd.
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Kim Han-soo
Department Of Electrical Engineering Seoul National University
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Kim Han-soo
Department Of Cardiology Ajou University School Of Medicine
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Park Jung-eon
School Of Electrical Eng. Seoul Nat'l University
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Yun Chong-man
Department Of Electrical Engineering Seoul National University
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Kim Seong-dong
Department Of Electrical Engineering University Of California
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LEE Byeong-Hoon
Department of Electrical Engineering, Seoul Nat'l University
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Jeon Jae-hong
The Author Is With The School Of Electrical Engineering Seoul National University
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Byeon Dae-Seok
Department of Electrical Engineering, Seoul National University
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Jun Jae
School Of Biomedical Engineering College Of Biomedical And Health Science Research Institute Of Biom
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Lee Seong-kyu
Department Of Cardiology Gachon University Of Medicine And Science
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LEE Seong-Kyu
Department of Biochemistry and Molecular Biology, Eulji University School of Medicine
著作論文
- New Poly-Si TFT with Selectively Doped Region in the Active Layer(Special Issue on Electronic Displays)
- A New Recessed Gate-Line Employing Air-Gap Gate-Data Line Inter-Crossover to Reduce Signal Delay for AMLCD (情報ディスプレイ--The 6th Asian Symposium on Information Display & Exhibition)
- A New Recessed Gate-Line Employing Air-gap Gate-Data Line Inter-Crossover to Reduce Signal Delay for AMLCD
- New Excimer Laser Recrystallization of Poly-Si for Effective Grain Growth and Grain Boundary Arrangement
- New Thin Film Transistor with Poly-Si Active Layer Consisting of Enlarged Grain Structure
- Excimer-Laser-Induced In-Situ Fluorine Passivation Effects on Polycrystalline Silicon Thin Film Transistors
- Excimer-Laser-Induced Fluorine Passivation Effects on Electrical Characteristics and Stability of Poly-Si TFTs
- Gate-Overlapped Lightly Doped Drain Poly-Si Thin Film Transistors by Employing Low-Temperature Doping Techniques
- Characteristics of New Poly-Si Thin Transistor with a-Si Channel Region Near the Source/Drain
- Fabrication of Gate Overlapped-LDD poly-Si TFT for Large Area AMLCD
- New Poly-Si Thin Film Transistors with a-Si Channel Region Designed to Reduce the Leakage Current
- A Characteristics of Buried Channel Poly-Si TFTs
- In-Situ Fabrication of Gate Oxide and Poly-Si Film by XeCl Excimer Laser Annealing
- A Novel LDD-Structured Poly-Si Thin Film Transistors with High ON/OFF Ratio
- Excimer Laser Induced Crystallization of Polycrystalline Silicon Films by Adding Oxygen
- Pixel Design for TFT-LCD with Double Gate Poly-Si TFT and Double Layer Storage Capacitor
- Offset Gated Poly-Si TFTs without Sacrificing ON Current during Charging Pixel
- New Poly-Silicon TFT Partially Crystallized by Excimer Laser Irradiation through ITO Gate
- New Poly-Silicon TFT Partially Crystallized by Excimer Laser Irradiation through ITO Gate
- Insitu Fabrication of High Quality Oxide and Poly-Si Film by Excimer Laser Irradiation
- A New Insulated Gate Bipolar Transistor Structure employing an Embedded Over-current Protection Device
- Increase of Breakdown Voltage in AlGaN/GaN HEMTs by Employing As+ Ion Implantation on SiO_2 Passivation Layer
- Hot-Carrier Stress Effects on AlGaN/GaN HEMTs Employing 500℃ Oxidized Ni/Au Gate
- SiO2 passivation effects on the leakage current in AlGaN/GaN high-electron-mobility transistors employing additional Schottky gate (Special issue: Solid state devices and materials)
- New field plate structure for suppression of leakage current of AlGaN/GaN high electron mobility transistors (Special issue: Solid state devices and materials)
- A new silicon-on-insulator lateral insulated gate bipolar transistor and lateral diode employing the separated schottky anode for a power integrated circuit (Special issue: Solid state devices and materials)
- A New Field Plate Structure for Suppression of Leakage Current of AlGaN/GaN HEMTs
- SiO_2 Passivation Effects on the Leakage Current in Dual-Gate AlGaN/GaN High Electron Mobility Transistors
- A New SOI Lateral Insulated Gate Bipolar Transistor and Lateral Diode employing the Separated Schottky Anode for a Power Integrated Circuit
- A New 1200V PT-IGBT with Protection Circuit employing the Lateral IGBT and Floating p-well Voltage Sensing Scheme
- Suppression of Leakage Current of Ni/Au Schottky Barrier Diode Fabricated on AlGaN/GaN Heterostructure by Oxidation (Special Issue: Solid State Devices & Materials)
- New Inductively Coupled Plasma-Chemical Vapor Deposition SiO2 Passivation for High-Voltage Switching AlGaN/GaN Heterostructure Field-Effect Transistors (Special Issue: Solid State Devices & Materials)
- A New Protection Circuit for improving Short-Circuit Withstanding Capability of Lateral Emitter Switched Thyristor (LEST)
- Experimental study on Improving Unclamped Inductive Switching Characteristics of the New Power MOSFET Employing Deep Body Contact
- Suppression of the leakage current of a Ni/Au Schottky Barrier Diode fabricated on AlGaN/GaN hetero-structure by oxidation
- A New ICP-CVD SiO_2 Passivation for High Voltage Switching AlGaN/GaN HFETs
- AlGaN/GaN High-Electron-Mobility Transistor Employing an Additional Gate for High-Voltage Switching Applications
- A New Conductivity Modulated LDMOSFET Employing Buried P Region and P^+ Drain
- Pulsed IVT Characteristics of AlGaN/GaN HEMT on the Isothermal Conditions
- A Dual Gate AlGaN/GaN HEMT For High Voltage Switching Applications
- Pulsed Current-Voltage-Temperature Characteristics of AlGaN/GaN High Electron Mobility Transistor under Isothermal Conditions
- Self-Aligned Offset-gated Poly-Si TFTs with Symmetric Source/Drain Characteristics
- Self-Aligned Offset Gated Poly-Si TFTs by Employing a Photo Resistor Reflow Process
- In-Situ Doped CMOS Polysilicon Thin Film Transistors
- Polysilicon Thin Film Transistors with PN Junction Gate
- Effects of Hydrogenation Treatment with Various Multi-channel Poly-Si TFT
- Dual-Gate Shorted Anode SOI Lateral Insulated Gate Bipolar Transistor Suppressing the Snap-Back
- A New Dual-Gate SOI LIGBT with the Shorted Anode
- A Insitu Vacuum Encapsulated Novel Lateral Field Emitter Triode with Titanium Cathode
- A Comparison of Poly Silicon and Titanium Polycide for Field Emission Tip
- Hydrogen Passivation on the Grain Boundary and Intragranular Defects in Various Polysilicon Thin-Film Taransistors
- Post-annealing Effects on the Characteristics of Poly-Si TFT's
- Post-annealing Effects on the Characteristics of Poly-Si TFT's
- Hydrogen Passivation on the Grain Boundary and Intragranular Defects in Various Polysilicon Thin Film Transistors
- Structural Dimension Effects of Plasma Hydrogenation on Low-Temperature Poly-Si Thin Film Transistors
- A Novel Bottom-Gate Poly-Si Thin Film Transistors with High ON/OFF Current Ratio
- Trench Insulated Gate Bipolar Transistor for the Improved Short Circuit Capability Employing Curved Junction and Wide Cell Pitch
- A New Voltage between Collector and Emitter (V_) Sensing Scheme for Short-Circuit Withstanding Capability of the Insulated Gate Bipolar Transistor
- A New Junction Termination in Power Semiconductor Devices employing Trench
- A New Lateral Dual-Gate Thyristor with Current Saturation
- A Novel SOI Carrier-Inducing Barrier-Controlled LIGBT with High Switching Speed
- Bipolar-Field-Effect-Transistor Hybrid-Mode Operation of Lateral Silicon-on-Insulator Bipolar Mode Field Effect Transistor with Improved Current Gain
- A Hybrid Lateral SOI BMFET with High Current Gain
- Multi channel AlGaN/GaN HEMTs for high breakdown voltage and low leakage current
- Electrostatic Discharge Effects on AlGaN/GaN High Electron Mobility Transistors on Sapphire Substrates
- Suppression of Current-Induced Degradation in Laser-Crystallized Polycrystalline Silicon Films by Adding Oxygen
- The effect of interface trap charges on poly-Si TFT
- The effect of interface trap charges on poly-Si TFT
- A New Lateral Dual-Gate Thyristor with Current Saturation
- A New Junction Termination in Power Semiconductor Devices employing Trench
- Low-Loss Schottky Rectifier Utilizing Trench Sidewall as Junction-Barrier-Controlled Schottky Contact
- A Trench-Gate Silicon-on-Insulator Lateral Insulated Gate Bipolar Transistor with the p^+ Cathode Well