Jeon Jae-Hong | School of Electrical Engineering, Seoul National University
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概要
関連著者
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Jeon Jae-Hong
School of Electrical Engineering, Seoul National University
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Han Min-Koo
School of Electrical al Engineering and Computer Science #50, Seoul National University, Seoul 151-742, Korea
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Han Min-koo
School Of Electrical Eng. & Computer Science #50 Seoul National University
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Han M‐k
The Author Is With The School Of Electrical Engineering Seoul National University
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Han M‐k
Seoul Nat'l Univ. Seoul Kor
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JEON Jae-Hong
The author is with the School of Electrical Engineering, Seoul National University
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Han Min-Koo
School of Electrical Engineering, Seoul National University
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Jeon J‐h
Seoul National Univ. Seoul Kor
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Han Min-koo
School Of Electrical Engineering And Computer Science #50 Seoul National University
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Jun Jae-hong
Department Of Electrical Engineering Seoul National University
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Jun Jae
School Of Electrical Engineeririg Seoul National University
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Park Kee-chan
School Of E1ectrical Engineering Seoul National University
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Lee Min-cheol
School Of Electrical Engineering Seoul National University
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Lee Min-Cheol
School of Electrical Engineering, Seoul National University
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PARK Kee-Chan
School of Electrical Engineering, Seoul National University
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Park K‐c
Lg Electronics Inc. Seoul Kor
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Lee M‐c
Seoul National Univ. Seoul Kor
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Park C‐m
Samsung Electronics Co. Ltd. Kyungki‐do Kor
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Kim Chun-hong
School Of Electrical Engineering Seoul National University
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KIM Cheon-Hong
School of Electrical Engineering, Seoul National University
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YOO Juhn-Suk
School of Electrical Engineering, Seoul National University
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PARK Cheol-Min
School of Electrical Engineering, Seoul National University
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Yoo Juhn-suk
The Author Is With The School Of Electrical Engineering Seoul National University
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Kim Cheon-hong
School Of Electrical Engineering Seoul National University
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Park Cheol-min
School Of Electrical Engineering Seoul National University
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Yoo Juhn-suk
Department Of Electrical Engineering Seoul National University
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Yoo Juhn
School Of Electrical Engineeririg Seoul National University
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Choi Hong-seok
School Of Electrical Engineering Seoul National University
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Choi Kwon-Young
School of Chemical and Biological Engineering, Institute of Molecular Biology and Genetics, Institut
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Choi K‐y
Seoul National Univ. Seoul Kor
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Park Jin-Woo
School of Electrical Engineering, Seoul National University
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Park Jin-woo
School Of Electrical Engineering Seoul National University
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Park Jin-woo
Department Of Biochemistry Chonbuk National University Medical School And Institute For Medical Scie
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Park Jin-woo
Department Of Plant Pathology National Institute Of Agricultural Science And Technology Korea
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Choi Hong-seok
Department Of Electrical Engineering And Computer Science Korea Advanced Institute Of Science And Te
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Choi Kwon-young
School Of Chemical And Biological Engineering Institute Of Molecular Biology And Genetics Institute
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Kim C‐h
Korea Advanced Inst. Sci. And Technol. Daejeon Kor
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Kim C‐h
Seoul National Univ. Seoul Kor
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LEE Jae-Hoon
School of Electrical Engineering & Computer Science Kyungpook National University
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Park Sang-Hee
Oxide Electronics Research Team, Electronics Telecommunications Research Institute (ETRI), Daejeon 305-350, Korea
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Hwang Chi-Sun
Oxide Electronics Research Team, Electronics Telecommunications Research Institute (ETRI), Daejeon 305-350, Korea
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Yoon Sung
Oxide Electronics Research Team, Electronics Telecommunications Research Institute (ETRI), Daejeon 305-350, Korea
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Park Sang-Geun
School of Electrical Engineering (#50), Seoul National University, San 56-1, Gwanak-gu, Seoul 151-742, Korea
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Ko Park
Oxide Electronics Research Team, Electronics Telecommunications Research Institute (ETRI), Daejeon 305-350, Korea
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Ryu Minki
Oxide Electronics Research Team, Electronics Telecommunications Research Institute (ETRI), Daejeon 305-350, Korea
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Yang Shinhyuk
Oxide Electronics Research Team, Electronics Telecommunications Research Institute (ETRI), Daejeon 305-350, Korea
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Kim Kyounghwan
Oxide Electronics Research Team, Electronics Telecommunications Research Institute (ETRI), Daejeon 305-350, Korea
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Huh Jong-moo
LCD R&D Center, Samsung Electronics Co., Ltd., Korea
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Lee Jae-Hoon
School of Electrical Engineering and Computer Science #50, Seoul National University, Seoul, Korea
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Goh Joon-chul
LCD R&D Center, Samsung Electronics Co., Ltd., Korea
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Choi Joonhoo
LCD R&D Center, Samsung Electronics Co., Ltd., Korea
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Chung Kyuha
LCD R&D Center, Samsung Electronics Co., Ltd., Korea
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Goh Joon-chul
LCD R&D Center, Samsung Electronics Co., Ltd., Korea
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Chung Kyuha
LCD R&D Center, Samsung Electronics Co., Ltd., Korea
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Han Min-Koo
School of Electrical Engineering and Computer Science #50, Seoul National University, Seoul, Korea
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Jeon Jae-Hong
School of Electronics, Hankuk Aviation University, Gyeonggi-do, Korea
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Jeon Jae-Hong
School of Electronics, Telecommunications, and Computer Engineering, Korea Aerospace University, Goyang, Gyeonggido 412-791, Korea
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Choi Joonhoo
LCD R&D Center, Samsung Electronics Co., Ltd., Korea
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Jeon Jae-Hong
School of Electrical Engineering, Seoul National University, Seoul 151-742, Korea
著作論文
- A New Recessed Gate-Line Employing Air-Gap Gate-Data Line Inter-Crossover to Reduce Signal Delay for AMLCD (情報ディスプレイ--The 6th Asian Symposium on Information Display & Exhibition)
- A New Recessed Gate-Line Employing Air-gap Gate-Data Line Inter-Crossover to Reduce Signal Delay for AMLCD
- New Excimer Laser Recrystallization of Poly-Si for Effective Grain Growth and Grain Boundary Arrangement
- New Thin Film Transistor with Poly-Si Active Layer Consisting of Enlarged Grain Structure
- Excimer-Laser-Induced In-Situ Fluorine Passivation Effects on Polycrystalline Silicon Thin Film Transistors
- Excimer-Laser-Induced Fluorine Passivation Effects on Electrical Characteristics and Stability of Poly-Si TFTs
- New Poly-Si Thin Film Transistors with a-Si Channel Region Designed to Reduce the Leakage Current
- New Poly-Silicon TFT Partially Crystallized by Excimer Laser Irradiation through ITO Gate
- New Poly-Silicon TFT Partially Crystallized by Excimer Laser Irradiation through ITO Gate
- Light Response of Top Gate InGaZnO Thin Film Transistor
- New Fraction Time Annealing Method For Improving Organic Light Emitting Diode Current Stability of Hydorgenated Amorphous Silicon Thin-Film Transistor Based Active Matrix Organic Light Emitting Didode Backplane
- New Excimer Laser Recrystallization of Poly-Si for Effective Grain Growth and Grain Boundary Arrangement