Park Sang-Geun | School of Electrical Engineering (#50), Seoul National University, San 56-1, Gwanak-gu, Seoul 151-742, Korea
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概要
- Park Sang-Geunの詳細を見る
- 同名の論文著者
- School of Electrical Engineering (#50), Seoul National University, San 56-1, Gwanak-gu, Seoul 151-742, Koreaの論文著者
関連著者
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Park Sang-Geun
School of Electrical Engineering (#50), Seoul National University, San 56-1, Gwanak-gu, Seoul 151-742, Korea
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Han Min-Koo
School of Electrical al Engineering and Computer Science #50, Seoul National University, Seoul 151-742, Korea
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Han Min-koo
School Of Electrical Eng. & Computer Science #50 Seoul National University
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Kim Sun-Jae
School of Electrical Engineering (#50), Seoul National University, San 56-1, Gwanak-gu, Seoul 151-742, Korea
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Jeon Jae-Hong
School of Electrical Engineering, Seoul National University
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LEE Jae-Hoon
School of Electrical Engineering & Computer Science Kyungpook National University
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Park Sang-Geun
School of Electrical Engineering and Computer Science #50, Seoul National University, Seoul, Korea
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Sang-Geun Park
School of Electrical Engineering, Seoul National University, 599 Gwanak-ro, Gwanak-gu, Seoul 151-742, Korea
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Park Sang-Geun
School of Electrical Engineering, Seoul National University, Seoul 151-742, Korea
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Kim Sun-Jae
School of Electrical Engineering, Seoul National University, 599 Gwanak-ro, Gwanak-gu, Seoul 151-742, Korea
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Ji Seon-Beom
School of Electrical Engineering, Seoul National University, 599 Gwanak-ro, Gwanak-gu, Seoul 151-742, Korea
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Min-Koo Han
School of Electrical Engineering, Seoul National University, 599 Gwanak-ro, Gwanak-gu, Seoul 151-742, Korea
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Shin Hee-Sun
School of Electrical Engineering #50, Seoul National University, 151-742 Seoul, Korea
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Lee Hye-Jin
School of Electrical Engineering #50, Seoul National University, Shinlim-dong, Gwanak-gu, Seoul 151-742, Korea
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Shin Hee-Sun
School of Electrical Engineering and Computer Science #50, Seoul National University, Seoul, Korea
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Huh Jong-moo
LCD R&D Center, Samsung Electronics Co., Ltd., Korea
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Kang Chi-Jung
Deptartment of Physics, Myoungji University, Yongin 449-728, Korea
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Han Sang-Myeon
School of Electrical Engineering #50, Seoul National University, Shinlim-dong, Gwanak-gu, Seoul 151-742, Korea
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Lee Jae-Hoon
School of Electrical Engineering and Computer Science #50, Seoul National University, Seoul, Korea
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Goh Joon-chul
LCD R&D Center, Samsung Electronics Co., Ltd., Korea
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Choi Joonhoo
LCD R&D Center, Samsung Electronics Co., Ltd., Korea
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Chung Kyuha
LCD R&D Center, Samsung Electronics Co., Ltd., Korea
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Goh Joon-chul
LCD R&D Center, Samsung Electronics Co., Ltd., Korea
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Chung Kyuha
LCD R&D Center, Samsung Electronics Co., Ltd., Korea
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Lee Hye-Jin
School of Electrical Engineering and Computer Science #50, Seoul National University, Seoul, Korea
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Lee Won-Kyu
School of Electrical Engineering (#50), Seoul National University, San 56-1, Gwanak-gu, Seoul 151-742, Korea
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Lee Won-Kyu
School of Electrical Engineering #50, Seoul National University, Shinlim-dong, Gwanak-gu, Seoul 151-742, Korea
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Han Min-Koo
School of Electrical Engineering and Computer Science #50, Seoul National University, Seoul, Korea
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Seong Seung-Yeon
Deptartment of Physics, Myoungji University, Yongin 449-728, Korea
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Jeon Jae-Hong
School of Electronics, Hankuk Aviation University, Gyeonggi-do, Korea
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Sun-Jae Kim
School of Electrical Engineering, Seoul National University, 599 Gwanak-ro, Gwanak-gu, Seoul 151-742, Korea
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Min-Koo Han
School of Electrical Engineering and Computer Science #50, Seoul National University, Gwanak 599 Gwanak-ro, Gwanak-gu, Seoul 151-742, Korea
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Han Min-Koo
School of Electrical Engineering (#50), Seoul National University, San 56-1, Gwanak-gu, Seoul 151-742, Korea
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Nam Woo-Jin
School of Electrical Engineering #50, Seoul National University, 151-742 Seoul, Korea
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Nam Woo-Jin
School of Electrical Engineering and Computer Science #50, Seoul National University, Seoul, Korea
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Choi Joonhoo
LCD R&D Center, Samsung Electronics Co., Ltd., Korea
著作論文
- Effect of Drain Bias Stress on Stability of Nanocrystalline Silicon Thin Film Transistors with Various Channel Lengths
- New Fraction Time Annealing Method For Improving Organic Light Emitting Diode Current Stability of Hydorgenated Amorphous Silicon Thin-Film Transistor Based Active Matrix Organic Light Emitting Didode Backplane
- Lateral Diffusion of Phosphorous Induced by Excimer Laser Irradiation of Silicon Thin Film for Formation of Gradual Lightly Doped Region in Polycrystalline Silicon Thin Film Transistors
- Low-Voltage Driven P-Type Polycrystalline Silicon Thin-Film Transistor Integrated Gate Driver Circuits for Low-Cost Chip-on-Glass Panel
- Suppression of Leakage Current in Solid-Phase Crystallization Silicon Thin-Film Transistors Employing Off-State-Bias Annealing