Min-Koo Han | School of Electrical Engineering and Computer Science #50, Seoul National University, Gwanak 599 Gwanak-ro, Gwanak-gu, Seoul 151-742, Korea
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- 同名の論文著者
- School of Electrical Engineering and Computer Science #50, Seoul National University, Gwanak 599 Gwanak-ro, Gwanak-gu, Seoul 151-742, Koreaの論文著者
関連著者
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Min-Koo Han
School of Electrical Engineering and Computer Science #50, Seoul National University, Gwanak 599 Gwanak-ro, Gwanak-gu, Seoul 151-742, Korea
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Min-Koo Han
School of Electrical Engineering, Seoul National University, 599 Gwanak-ro, Gwanak-gu, Seoul 151-742, Korea
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Kim Sun-Jae
School of Electrical Engineering (#50), Seoul National University, San 56-1, Gwanak-gu, Seoul 151-742, Korea
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Kim Sun-Jae
School of Electrical Engineering, Seoul National University, 599 Gwanak-ro, Gwanak-gu, Seoul 151-742, Korea
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Choi Sung-hwan
School Of Advanced Materials Engineering Andong National University
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Choi Young-hwan
School Of Electrical Eng. & Computer Science #50 Seoul National University
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Sang-Geun Park
School of Electrical Engineering, Seoul National University, 599 Gwanak-ro, Gwanak-gu, Seoul 151-742, Korea
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Park Sang-Geun
School of Electrical Engineering (#50), Seoul National University, San 56-1, Gwanak-gu, Seoul 151-742, Korea
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Ji Seon-Beom
School of Electrical Engineering, Seoul National University, 599 Gwanak-ro, Gwanak-gu, Seoul 151-742, Korea
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Kuk Seung-Hee
School of Electrical Engineering and Computer Science #50, Seoul National University, San 56-1 Shinlim-dong, Kwanak-gu, Seoul 151-742, Korea
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Yeon-Gon Mo
Corporate R&D Center, Samsung Mobile Display Co., Ltd., Yongin, Kyeonggi-do 446-711, Korea
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Mo Yeon-Gon
Corporate R&D Center, Samsung Mobile Display Co., Ltd., Yongin, Gyeonggi 446-711, Korea
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Kang Dong-Won
School of Electrical Engineering, Seoul National University, Seoul 151-742, Republic of Korea
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Kwang-Sun Ji
Solar Energy Group, LG Electronics Institute of Technology, Seoul 137-724, Korea
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Ji Kwang-sun
Solar Energy Team, Materials and Components R&D Laboratory, LG Electronics Advanced Research Institutes, Seoul 137-724, Korea
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Dong-Won Kang
School of Electrical Engineering, Seoul National University, Seoul 151-742, Korea
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Seh-Won Ahn
Solar Energy Group, LG Electronics Institute of Technology, Seoul 137-724, Korea
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Min-Ki Kim
School of Electrical Engineering and Computer Science, Seoul National University, Gwanak-gu, Seoul 151-744, Korea
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Kim Young-Shil
School of Electrical Engineering and Computer Science, Seoul National University, Gwanak-gu, Seoul 151-744, Korea
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Ogyun Seok
School of Electrical Engineering and Computer Science, Seoul National University, Gwanak-gu, Seoul 151-744, Korea
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Young-Shil Kim
School of Electrical Engineering and Computer Science, Seoul National University, Gwanak-gu, Seoul 151-744, Korea
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Sun-Jae Kim
School of Electrical Engineering, Seoul National University, 599 Gwanak-ro, Gwanak-gu, Seoul 151-742, Korea
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Sun-Jae Kim
School of Electrical Engineering and Computer Science #50, Seoul National University, Gwanak 599 Gwanak-ro, Gwanak-gu, Seoul 151-742, Korea
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Sun-Jae Kim
School of Electrical Engineering and Computer Science, Seoul National University, Gwanak-gu, Seoul 151-744, Korea
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Min-Koo Han
School of Electrical Engineering, Seoul National University, Seoul 151-742, Korea
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Min-Koo Han
School of Electrical Engineering and Computer Science, Seoul National University, Gwanak-gu, Seoul 151-744, Korea
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Young-Hwan Choi
School of Electrical Engineering and Computer Science, Seoul National University, Gwanak-gu, Seoul 151-744, Korea
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Sung-Hwan Choi
School of Electrical Engineering and Computer Science #50, Seoul National University, Gwanak 599 Gwanak-ro, Gwanak-gu, Seoul 151-742, Korea
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Hye-Dong Kim
Corporate R&D Center, Samsung Mobile Display Co., Ltd., Yongin, Kyeonggi-do 446-711, Korea
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Hye-Dong Kim
Corporate R&D Center, Samsung Mobile Display Co., Ltd., Yongin, Kyeonggi-do 446-711, Korea
著作論文
- Effect of Drain Bias Stress on Stability of Nanocrystalline Silicon Thin Film Transistors with Various Channel Lengths
- Reliability in Short-Channel p-Type Polycrystalline Silicon Thin-Film Transistor under High Gate and Drain Bias Stress
- Highly Transparent and High Haze Bilayer Al-Doped ZnO Thin Film Employing Oxygen-Controlled Seed Layer
- High Voltage AlGaN/GaN High-Electron-Mobility Transistors Employing Surface Treatment by Deposition and Removal of Silicon Dioxide Layer