Lee Seung-chul | Fairchild Semiconductor Dodang-dong
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概要
関連著者
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Lee Seung-chul
Fairchild Semiconductor Dodang-dong
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JEON Byung-Chul
School of Electrical Eng. & Computer Science #50, Seoul National University
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Han Min-Koo
School of Electrical Engineering, Seoul National University
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OH Kwang-Hoon
Fairchild Semiconductor
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YUN Chong-Man
Fairchild Semiconductor
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Ji In-hwan
School Of Electrical Eng. & Computer Science #50 Seoul National University
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Choi Young-hwan
School Of Electrical Eng. & Computer Science #50 Seoul National University
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Han Min-Koo
School of Electrical al Engineering and Computer Science #50, Seoul National University, Seoul 151-742, Korea
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Han M‐k
The Author Is With The School Of Electrical Engineering Seoul National University
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Ha Min-woo
School Of Electrical Eng. & Computer Science #50 Seoul National University
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Choi Y‐i
School Of Electrical Eng. & Computer Science #50 Seoul National University
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Han M‐k
Seoul Nat'l Univ. Seoul Kor
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Han Min-koo
School Of Electrical Engineering Seoul National University
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Han Min-koo
School Of Electrical Engineering And Computer Science #50 Seoul National University
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JI In-Hwan
School of Electrical Eng., Seoul Nat'l Univ.
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CHOI Young-Hwan
School of Electrical Eng., Seoul Nat'l Univ.
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KIM Soo-Seong
Fairchild Semiconductor
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LEE Seung-Chul
School of Electrical Engineering (#50), Seoul National University
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Choi Yearn-ik
School Of Electrical Eng. & Computer Science #50 Seoul National University
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Kim Soo-seong
School Of Electrical Eng. & Computer Science #50 Seoul National University
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Jeon Byung-chul
School Of Electrical Eng. & Computer Science #50 Seoul National University
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Choi Young-hwan
School Of Electrical Eng. Seoul Nat'l Univ.
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Han Min-koo
School Of Electrical Eng. & Computer Science #50 Seoul National University
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Han Min-koo
School Of Electrical Eng. Seoul Nat'l Univ.
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Yun Chong-Man
Fairchild Semiconductor, Dodang-dong Wonmi-ku, Bucheon, Kyunggi-do 420-711, Korea
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Jeon Byung-Chul
School of Electrical Engineering #50, Seoul National University, Shinlim-dong, Gwanak-gu, Seoul 151-742, Korea
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Oh Kwang-Hoon
Fairchild Semiconductor, Dodang-dong Wonmi-ku, Bucheon, Kyunggi-do 420-711, Korea
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Ji In-Hwan
School of Electrical Engineering #50, Seoul National University, Shinlim-dong, Gwanak-gu, Seoul 151-742, Korea
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Choi Young-Hwan
School of Electrical Engineering #50, Seoul National University, Shinlim-dong, Gwanak-gu, Seoul 151-742, Korea
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Han Young-Hwan
Korea Atomic Energy Research Institute, Deokjin-dong, Yuseong-gu, Daejeon 350-353, Korea
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Lee Byung-Chul
Korea Atomic Energy Research Institute, Deokjin-dong, Yuseong-gu, Daejeon 350-353, Korea
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Lee Seung-Chul
Fairchild Semiconductor, Dodang-dong Wonmi-ku, Bucheon, Kyunggi-do 420-711, Korea
著作論文
- A New 1200V PT-IGBT with Protection Circuit employing the Lateral IGBT and Floating p-well Voltage Sensing Scheme
- Second Breakdown of 18V Grounded Gate NMOS induced by the Kirk Effect under Electrostatic Discharge
- A New 1200 V Punch Through-Insulated Gate Bipolar Transistor with Protection Circuit Employing Lateral Insulated Gate Bipolar Transistor and Floating p-Well Voltage Sensing Scheme