Anomalous Noise Degradation Caused by Device Size Effects in SOI MOSFETs

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概要

• 論文の詳細を見る
• 2001-09-25

著者

• LEE Jong

  School of Electrical Engineering, Seoul National University

• Lee Jong

  School Of Adv. Mat. Sci. & Eng. Sungkyunkwan Univ.

• Lee Joo-hyoung

  Memory R&d Division Hynix Semiconductor Co.

• Lee J‐h

  Lg Electronics Inst. Technol. Seoul Kor

• Park Young

  School Of Mechanical Engineering Yonsei University

• Lee J‐h

  Wonkwang Univ. Chonpuk Kor

• Chun Kwun-soo

  School Of Electrical Engineering And Computer Science Seoul National University

• Min Hong

  School Of Electrical Engineering And Computer Science And Isrc Seoul National University

• Min Hong

  School Of Electrical Engineering & Isrc Seoul National University

• Park Young

  School Of Electrical Engineering And Computer Science And Inter-university Of Semiconductor Research

• Park Young

  School Of Electrical Engineering & Isrc Seoul National University

• Park Young

  Department Of Electronics Engineering And Inter University Semiconductor Research Center Seoul Natio

• Lee Hyeokjae

  School Of Electrical Engineering Kookmin University

• Park Young

  School Of Electrical And Computer Engineering Sungkyunkwan University

• Lee Ju-Hyeon

  School of Electrical Engineering, Wonkwang University

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