Park Young | School Of Electrical Engineering & Isrc Seoul National University
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概要
- PARK Young Juneの詳細を見る
- 同名の論文著者
- School Of Electrical Engineering & Isrc Seoul National Universityの論文著者
関連著者
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Park Young
School Of Electrical Engineering & Isrc Seoul National University
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Park Young
School Of Electrical And Computer Engineering Sungkyunkwan University
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Park Young
School Of Mechanical Engineering Yonsei University
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Min Hong
School Of Electrical Engineering & Isrc Seoul National University
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Min Hong
School Of Electrical Engineering And Computer Science And Isrc Seoul National University
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Park Young
School Of Electrical Engineering And Computer Science And Inter-university Of Semiconductor Research
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Lee Joo-hyoung
Memory R&d Division Hynix Semiconductor Co.
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Park Y
School Of Electrical Engineering & Isrc Seoul National University
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Lee J‐h
Lg Electronics Inst. Technol. Seoul Kor
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Lee J‐h
Wonkwang Univ. Chonpuk Kor
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Chung In-young
School Of Electrical Engineering & Isrc Seoul National University
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Park Young
Department Of Electronics Engineering And Inter University Semiconductor Research Center Seoul Natio
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Lee Hyeokjae
School Of Electrical Engineering Kookmin University
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Lee Ju-Hyeon
School of Electrical Engineering, Wonkwang University
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Kim Sung
School Of Dentistry Kyunghee University
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LEE Jong
School of Electrical Engineering, Seoul National University
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Lee Jong
School Of Adv. Mat. Sci. & Eng. Sungkyunkwan Univ.
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MOON Sang
School of Chemical Engineering, Seoul National University
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Park No
School Of Mechanical Engineering Yonsei University
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Yang Hyunseok
School Of Mechanical Engineering Yonsei University
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Moon Sang
School Of Chemical Engineering And Institute Of Chemical Processes Seoul National University
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Song J
Sungkyunkwan Univ. Kyunggi-do Kor
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Song Joon
School Of Electrical And Computer Engineering Sungkyunkwan University
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Lee Jong-ho
School Of Electrical Engineering Wonkwang University
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Kim Sung
School Of Electrical And Computer Engineering Sungkyunkwan University
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Jeong Soon
Department Of Metallurgical System Engineering Yonsei University
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CHOI Jin
Interdisciplinary Course of Information Storage Engineering, School of Engineering, Yonsei Universit
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JUN Hong
DST Group, Digital Media Research Lab., LG Electronics
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YANG Hyun
School of Mechanical Engineering, Yonsei University
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Song Joon
School Of Electrical And Computer Engineering Shugkyunkwan University
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Jun Hong
Dst Group Digital Media Research Lab. Lg Electronics
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Chun Kwun-soo
School Of Electrical Engineering And Computer Science Seoul National University
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Kim Sung
School Of Computer Science And Engineering Chung-ang University
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Choi Jin
Interdisciplinary Course Of Information Storage Engineering School Of Engineering Yonsei University
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Moon Sang
School Of Electrical And Computer Engineering Sungkyunkwan University
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Yi Junsin
School of Electrical and Computer Engineering, Sungkyunkwan University
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Jeong Se
School Of Electrical And Computer Engineering Sungkyunkwan University
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Yi Junsin
School Of Electrical And Computer Engineering Sungkyunkwan University
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JEONG Kyu
School of Electrical and Computer Engineering, Sungkyunkwan University
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Shim Byung
School Of Electrical Engineering And Computer Science And Nano-systems Institute (nsi-ncrc) Seoul Na
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Jeong Kyu
School Of Electrical And Computer Engineering Sungkyunkwan University
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Lee Jong-ho
School Of Eecs Engineering Kyungpook National University
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Min Hong
School Of Electrical Engineering And Computer Science And Nano-systems Institute (nsi-ncrc) Seoul Na
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Park Young
School Of Electrical Engineering And Computer Science And Nano-systems Institute (nsi-ncrc) Seoul Na
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Kim Sung
School Of Computer Sci. And Engineering Chung-ang Univ.
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Moon Sang
School of Chemical and Biological Engineering, Seoul National University, San 56-1, Shillim-dong, Kwanak-ku, Seoul 151-744, Korea
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Lee Jong-Ho
School of EECS and ISRC, Seoul National University, Seoul 151-742, Korea
著作論文
- ORS-08 ROBUST H_∞ LOOP-SHAPING DESIGN FOR AN OPTICAL DISK DRIVE SYSTEM
- Pt and RuO_2 Bottom Electrode Effects on Pb(Zr,Ti)O_3 Memory Capacitors
- Time-Varying Body Instability and Low-Frequency Noise Characteristics of Mini-Field-Dual-Body Silicon-on-Insulator Structure for Analog-Digital Mixed-Mode Circuits
- Anomalous Noise Degradation Caused by Device Size Effects in SOI MOSFETs
- A New Charge Pumping Device
- A New Charge Pumping Device
- Spatial Distribution of Oxide Traps in Stressed Flash Memory