Park Young | School Of Electrical And Computer Engineering Sungkyunkwan University
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概要
関連著者
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Park Young
School Of Electrical And Computer Engineering Sungkyunkwan University
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Min Hong
School Of Electrical Engineering & Isrc Seoul National University
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Park Young
School Of Electrical Engineering & Isrc Seoul National University
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Park Young
School Of Mechanical Engineering Yonsei University
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Min Hong
School Of Electrical Engineering And Computer Science And Isrc Seoul National University
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Park Young
School Of Electrical Engineering And Computer Science And Inter-university Of Semiconductor Research
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Lee Joo-hyoung
Memory R&d Division Hynix Semiconductor Co.
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Park Y
School Of Electrical Engineering & Isrc Seoul National University
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Lee J‐h
Lg Electronics Inst. Technol. Seoul Kor
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Lee J‐h
Wonkwang Univ. Chonpuk Kor
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KIM Bomsoo
Korea Institute for Advanced Study
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Chung In-young
School Of Electrical Engineering & Isrc Seoul National University
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Park Young
Department Of Electronics Engineering And Inter University Semiconductor Research Center Seoul Natio
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Lee Hyeokjae
School Of Electrical Engineering Kookmin University
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BAEK Chang-Ki
School of Electrical Engineering and Computer Science and Nano-Systems Institute (NSI-NCRC), Seoul N
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Shim Byung
School Of Electrical Engineering And Computer Science And Nano-systems Institute (nsi-ncrc) Seoul Na
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Lee Ju-Hyeon
School of Electrical Engineering, Wonkwang University
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QUAN Wu-yun
Korea institute for Advanced Study
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Kim Sung
School Of Dentistry Kyunghee University
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LEE Jong
School of Electrical Engineering, Seoul National University
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Lee Jong
School Of Adv. Mat. Sci. & Eng. Sungkyunkwan Univ.
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MOON Sang
School of Chemical Engineering, Seoul National University
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Park No
School Of Mechanical Engineering Yonsei University
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Yang Hyunseok
School Of Mechanical Engineering Yonsei University
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Moon Sang
School Of Chemical Engineering And Institute Of Chemical Processes Seoul National University
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Song J
Sungkyunkwan Univ. Kyunggi-do Kor
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Song Joon
School Of Electrical And Computer Engineering Sungkyunkwan University
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Lee Jong-ho
School Of Electrical Engineering Wonkwang University
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Kim Sung
School Of Electrical And Computer Engineering Sungkyunkwan University
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Jeong Soon
Department Of Metallurgical System Engineering Yonsei University
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CHOI Jin
Interdisciplinary Course of Information Storage Engineering, School of Engineering, Yonsei Universit
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JUN Hong
DST Group, Digital Media Research Lab., LG Electronics
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YANG Hyun
School of Mechanical Engineering, Yonsei University
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Song Joon
School Of Electrical And Computer Engineering Shugkyunkwan University
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Kim Dae
Korea Atomic Energy Research Institute
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Lee Nae-eung
School Of Metallurgical And Materials Engineering Sungkyunkwan University
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Jun Hong
Dst Group Digital Media Research Lab. Lg Electronics
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Chun Kwun-soo
School Of Electrical Engineering And Computer Science Seoul National University
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Kim Sung
School Of Computer Science And Engineering Chung-ang University
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Chung In-young
Department Of Electronic Engineering Gyeongsang National University
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Choi Jin
Interdisciplinary Course Of Information Storage Engineering School Of Engineering Yonsei University
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Moon Sang
School Of Electrical And Computer Engineering Sungkyunkwan University
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Yi Junsin
School of Electrical and Computer Engineering, Sungkyunkwan University
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Jeong Se
School Of Electrical And Computer Engineering Sungkyunkwan University
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Yi Junsin
School Of Electrical And Computer Engineering Sungkyunkwan University
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KWON Wookhyun
Korea Institute for Advanced Study
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SONG Yunheub
Memory Division, Semiconductor Business, Samsung Electronics Company, Ltd.
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Jeong Seong
Department Of Chemical Engineering Sungkyunkwan University
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JEONG Kyu
School of Electrical and Computer Engineering, Sungkyunkwan University
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Jeong Kyu
School Of Electrical And Computer Engineering Sungkyunkwan University
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Quan Wu-yun
Institute Of Microelectronics Fudan University
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Lee Jong-ho
School Of Eecs Engineering Kyungpook National University
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Min Hong
School Of Electrical Engineering And Computer Science And Nano-systems Institute (nsi-ncrc) Seoul Na
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Kim Jin
School Of Biotechnology & Bioengineering Kangwon National University
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Park Young
School Of Electrical Engineering And Computer Science And Nano-systems Institute (nsi-ncrc) Seoul Na
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Kim Sung
School Of Computer Sci. And Engineering Chung-ang Univ.
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Quan Wu-yun
Institute of Microelectronics, Fudan University, 220 Handan Road, Shanghai 200433, China
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CHUNG In-Young
Department of Electronics and Communications Engineering, Kwangwoon University
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SEO Sung
School of Electrical Engineering, Seoul National University
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Cha Seon-Yong
R&D Division, Hynix Semiconductor Inc., San 136-1 Ami-ri, Bubal-eub, Ichon, Kyoungki-do 467-701, Korea
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CHA Seon-Yong
R&D Division, Hynix Semiconductor Inc.
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LEE Myungjin
R&D Division, Hynix Semiconductor Inc.
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JANG Taesu
R&D Division, Hynix Semiconductor Inc.
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Kwon Bong
School of Advanced Materials Science and Engineering and Center for Advanced Plasma Surface Technology, Sungkyunkwan University, Suwon, Kyunggi-do 440-746, Korea
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Jeong Seong
Department of Ceramic Engineering, Yonsei University, Seoul 120-749, Korea
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Baek Chang-Ki
School of Electrical Engineering and Computer Science and Nano-Systems Institute (NSI-NCRC), Seoul National University, Seoul 151-744, Korea
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Baek Chang-Ki
School of Electrical Engineering and Computer Science, and ISRC, Seoul National University, P.O. Box 34 Kwanak, Seoul 151-744, Korea
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Ahn Joung-ho
School of Advanced Materials Science and Engineering and Center for Advanced Plasma Surface Technology, Sungkyunkwan University, Suwon, Kyunggi-do 440-746, Korea
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Lee Hag
School of Advanced Materials Science and Engineering and Center for Advanced Plasma Surface Technology, Sungkyunkwan University, Suwon, Kyunggi-do 440-746, Korea
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Shon J.
Jusung Engineering Co., Ltd., 49 Neungpyeong-ri, Opo-eup, Gwangju, Gyeonggi-do 464-892, Korea
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Baek Chang-Ki
Department of Electronic and Electrical Engineering, Pohang University of Science and Technology (POSTECH), Pohang 790-784, Korea
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Lee Nae-Eung
School of Advanced Materials Science and Engineering and Center for Advanced Plasma Surface Technology, Sungkyunkwan University, Suwon, Kyunggi-do 440-746, Korea
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Song Yunheub
Memory Division, Semiconductor Business, Samsung Electronics Company, Ltd., Kyungki-Do 449-900, Korea
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PARK Young
School of Electrical Engineering, Seoul National University
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Park Young
School of Electrical Engineering and Computer Science, and ISRC, Seoul National University, P.O. Box 34 Kwanak, Seoul 151-744, Korea
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Min Hong
School of Electrical Engineering and Computer Science and Nano-Systems Institute (NSI-NCRC), Seoul National University, Seoul 151-744, Korea
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Min Hong
School of Electrical Engineering and Computer Science, and ISRC, Seoul National University, P.O. Box 34 Kwanak, Seoul 151-744, Korea
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Kim Jin
School of Advanced Materials Science and Engineering and Center for Advanced Plasma Surface Technology, Sungkyunkwan University, Suwon, Kyunggi-do 440-746, Korea
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JANG Taesu
R&D Division, Hynix Semiconductor Inc.
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JEONG Seong
Department of Electronics and Communications Engineering, Kwangwoon University
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Kim Bomsoo
Korea Institute for Advanced Study, 207-43 Cheongryangri, Seoul, Korea
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Moon Sang
School of Chemical and Biological Engineering, Seoul National University, San 56-1, Shillim-dong, Kwanak-ku, Seoul 151-744, Korea
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Choi SeongWook
School of Electrical Engineering and Computer Science, Seoul National University, Seoul 151-744, Korea
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Park Sooyoung
School of Electrical Engineering and Computer Science, Seoul National University, Seoul 151-744, Korea
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Kwon Wookhyun
Korea Institute for Advanced Study, 207-43 Cheongryangri, Seoul, Korea
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Lee Jong-Ho
School of EECS and ISRC, Seoul National University, Seoul 151-742, Korea
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Shim Byung
School of Electrical Engineering and Computer Science and Nano-Systems Institute (NSI-NCRC), Seoul National University, Seoul 151-744, Korea
著作論文
- ORS-08 ROBUST H_∞ LOOP-SHAPING DESIGN FOR AN OPTICAL DISK DRIVE SYSTEM
- Pt and RuO_2 Bottom Electrode Effects on Pb(Zr,Ti)O_3 Memory Capacitors
- Time-Varying Body Instability and Low-Frequency Noise Characteristics of Mini-Field-Dual-Body Silicon-on-Insulator Structure for Analog-Digital Mixed-Mode Circuits
- Anomalous Noise Degradation Caused by Device Size Effects in SOI MOSFETs
- A New Charge Pumping Device
- A New Charge Pumping Device
- An Analysis of the Field Dependence of Interface Trap Generation under Negative Bias Temperature Instability Stress using Wentzel--Kramers--Brillouin with Density Gradient Method
- Inductively Coupled Plasma Etching of Chemical-Vapor-Deposited Amorphous Carbon in N2/O2/Ar Chemistries
- Spatial Distribution of Oxide Traps in Stressed Flash Memory
- New Multiple-Times Programmable CMOS ROM Cell
- Design Technique for Ramped Gate Soft-Programming in Over-Erased NOR Type Flash EEPROM Cells
- High Speed, Low Power Programming in 0.17μm Channel Length NOR-type Floating Gate Flash Memory Cell Free of Drain Turn-On Effects
- Spatial Distribution of Oxide Traps in Stressed Flash Memory